<p>We have investigated the optical properties of AlGaN grown on sapphire. It is found that two main luminescence peaks occur in the cathodoluminescence (CL) spectra of AlGaN films, and their energy separation increases with the increase of Al source flux during the growth. Spatially resolved CL investigations have shown that the line splitting is a result of variation of AlN mole fraction within the layer. The Al composition varies in both lateral and vertical direction. It is suggested that the difference in the surface mobility of Al and Ga atoms, especially, its strong influence on the initial island coalescence process and the formation of island-like regions on the uneven film surface, is responsible for the Al composition inhomogenei...
Compositional, structural, and optical properties of molecular-beam epitaxy grown Al(x)Ga(1-x)N film...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
Transmission electron microscopy has been used to characterize Al segregation in Al0.1Ga0.9N and Al0...
We have investigated the optical properties of AlGaN grown on sapphire. It is found that two main lu...
The A1 compositional distribution of A1GaN is investigated by cathodoluminescence (CL). Monochromati...
The deep level luminescence of crack-free Al0.25Ga0.75N layers grown on a GaN template with a high-t...
The effect of Al doping in GaN films grown by metalorganic chemical vapor deposition was investigate...
We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence ...
We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence ...
The influences of a high-temperature (HT) AlN interlayer (IL) on the phase separation in crack-free ...
High quality epitaxial films of A(l)xGa(1-x)N, grown on SiC substrates, were investigated using spat...
A set of AlGaN epilayers were grown on sapphire (0001) substrate by MOCVD, with intermediate growths...
The in situ optical reflectivity measurements are employed to monitor the GaN epilayer growth proces...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
Compositional, structural, and optical properties of molecular-beam epitaxy grown Al(x)Ga(1-x)N film...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
Transmission electron microscopy has been used to characterize Al segregation in Al0.1Ga0.9N and Al0...
We have investigated the optical properties of AlGaN grown on sapphire. It is found that two main lu...
The A1 compositional distribution of A1GaN is investigated by cathodoluminescence (CL). Monochromati...
The deep level luminescence of crack-free Al0.25Ga0.75N layers grown on a GaN template with a high-t...
The effect of Al doping in GaN films grown by metalorganic chemical vapor deposition was investigate...
We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence ...
We have investigated the optical properties of thick InGaN film grown on GaN by cathodeluminescence ...
The influences of a high-temperature (HT) AlN interlayer (IL) on the phase separation in crack-free ...
High quality epitaxial films of A(l)xGa(1-x)N, grown on SiC substrates, were investigated using spat...
A set of AlGaN epilayers were grown on sapphire (0001) substrate by MOCVD, with intermediate growths...
The in situ optical reflectivity measurements are employed to monitor the GaN epilayer growth proces...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
Compositional, structural, and optical properties of molecular-beam epitaxy grown Al(x)Ga(1-x)N film...
A depth-resolved study of the optical and structural properties of wurtzite InGaN/GaN bilayers grown...
Transmission electron microscopy has been used to characterize Al segregation in Al0.1Ga0.9N and Al0...