Add to ORKGAbstract: We consider a problem of synthesis of two-pole contact circuits which realize Boolean functions on n variables and permit of short fault detection and diagnostic tests regarding contact closures. It is obtained than almost all Boolean functions on n variables are realizable by irredundant two-pole contact circuits which permit of single fault detection, complete fault detection, and single diagnostic tests of a constant length. The following facts are also proved: 1) each Boolean function f(x1,…,xn) can be realized by an irredundant two-pole contact circuit which contains not more than one input variable different from variables x1,…,xnand permits of single and complete fault detection tests lengths of which do not excee...
Abstract: For each Boolean function, we find the exact value of minimal possible length of...
A test diagnostics method is proposed using partial duplication of a tested unit. Checking system is...
When digital computer logic modules contain a large number of gates and have many input and output t...
Abstract: We prove that, for n≥2, one can implement each Boolean function on n variables b...
Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis {&...
Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis {&...
Abstract: We consider a problem of synthesis of logic networks implementing Boo lean funct...
Abstract: We consider a problem of synthesis of irredundant logic networks in the basis {&...
Abstract: It is established that one can implement almost any Boolean function on n variab...
Abstract: The following assertions are proved: for each natural k, there exists a basis co...
Abstract: It is proved that one can implement any Boolean function by a logic network in t...
Detection testing of Boolean functions implemented by Boolean circuits, which are affected by single...
AbstractWe investigate a model of gate failure for Boolean circuits in which a faulty gate is restri...
Abstract: Problem statement: The faults in digital circuit can be classified broadly as single stuck...
AbstractA method for obtaining lower bounds on the contact circuit complexity of explicitly defined ...
Abstract: For each Boolean function, we find the exact value of minimal possible length of...
A test diagnostics method is proposed using partial duplication of a tested unit. Checking system is...
When digital computer logic modules contain a large number of gates and have many input and output t...
Abstract: We prove that, for n≥2, one can implement each Boolean function on n variables b...
Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis {&...
Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis {&...
Abstract: We consider a problem of synthesis of logic networks implementing Boo lean funct...
Abstract: We consider a problem of synthesis of irredundant logic networks in the basis {&...
Abstract: It is established that one can implement almost any Boolean function on n variab...
Abstract: The following assertions are proved: for each natural k, there exists a basis co...
Abstract: It is proved that one can implement any Boolean function by a logic network in t...
Detection testing of Boolean functions implemented by Boolean circuits, which are affected by single...
AbstractWe investigate a model of gate failure for Boolean circuits in which a faulty gate is restri...
Abstract: Problem statement: The faults in digital circuit can be classified broadly as single stuck...
AbstractA method for obtaining lower bounds on the contact circuit complexity of explicitly defined ...
Abstract: For each Boolean function, we find the exact value of minimal possible length of...
A test diagnostics method is proposed using partial duplication of a tested unit. Checking system is...
When digital computer logic modules contain a large number of gates and have many input and output t...