We present first self-consistent modelling of x-ray photoelectron spectroscopy (XPS) Ti 2p, N ls, 0 ls, and C ls core level spectra with a cross-peak quantitative agreement for a series of TiN thin films grown by dc magnetron sputtering and oxidized to different extent by varying the venting temperature Tv of the vacuum chamber before removing the deposited samples. So-obtained film series constitute a model case for XPS application studies, where certain degree of atmosphere exposure during sample transfer to the XPS instrument is unavoidable. The challenge is to extract information about surface chemistry without invoking destructive pre-cleaning with noble gas ions. All TiN surfaces are thus analyzed in the as-received state by XPS using...
High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on S...
We report x-ray photoelectron spectroscopy (XPS) core level binding energies (BEs) for the widely-ap...
FAPESP - FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULOCAPES - COORDENAÇÃO DE APERFEIÇOAMENTO ...
We present first self-consistent modelling of x-ray photoelectron spectroscopy (XPS) Ti 2p, N ls, 0 ...
We present the first measurements of x-ray photoelectron spectroscopy (XPS) core level binding energ...
We report x-ray photoelectron spectroscopy (XPS) analysis of native Ti target surface chemistry duri...
Ar+ sputter etching is often used prior to X-ray photoelectron spectroscopy (XPS) analyses with the ...
There is a growing concern within the surface science community that the massive increase in the num...
The depth profile of thin film layers on bulk substrate, avoiding the cross-sectioning of samples, i...
With more than 9000 papers published annually, X-ray photoelectron spectroscopy (XPS) is an indispen...
Abstract. Intentionally deposited thin films exposed to atmosphere often develop unintentionally dep...
The type and degree of contamination on surfaces intended for X-ray photoelectron spectroscopy (XPS)...
We present a new synchrotron X-ray photoelectron spectroscopy strategy for surface chemical analysis...
Self-cleansing of transition metal nitrides is discovered to take place during ultra-high vacuum ann...
The C1s signal from ubiquitous carbon contamination on samples forming during air exposure, so calle...
High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on S...
We report x-ray photoelectron spectroscopy (XPS) core level binding energies (BEs) for the widely-ap...
FAPESP - FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULOCAPES - COORDENAÇÃO DE APERFEIÇOAMENTO ...
We present first self-consistent modelling of x-ray photoelectron spectroscopy (XPS) Ti 2p, N ls, 0 ...
We present the first measurements of x-ray photoelectron spectroscopy (XPS) core level binding energ...
We report x-ray photoelectron spectroscopy (XPS) analysis of native Ti target surface chemistry duri...
Ar+ sputter etching is often used prior to X-ray photoelectron spectroscopy (XPS) analyses with the ...
There is a growing concern within the surface science community that the massive increase in the num...
The depth profile of thin film layers on bulk substrate, avoiding the cross-sectioning of samples, i...
With more than 9000 papers published annually, X-ray photoelectron spectroscopy (XPS) is an indispen...
Abstract. Intentionally deposited thin films exposed to atmosphere often develop unintentionally dep...
The type and degree of contamination on surfaces intended for X-ray photoelectron spectroscopy (XPS)...
We present a new synchrotron X-ray photoelectron spectroscopy strategy for surface chemical analysis...
Self-cleansing of transition metal nitrides is discovered to take place during ultra-high vacuum ann...
The C1s signal from ubiquitous carbon contamination on samples forming during air exposure, so calle...
High-vacuum XPS have been used to analyse the surface modification of a 3 nm-thick Sn thin film on S...
We report x-ray photoelectron spectroscopy (XPS) core level binding energies (BEs) for the widely-ap...
FAPESP - FUNDAÇÃO DE AMPARO À PESQUISA DO ESTADO DE SÃO PAULOCAPES - COORDENAÇÃO DE APERFEIÇOAMENTO ...