Electron energy-loss spectroscopy (EELS) is an analytical microscopy technique which measures the energy lost by electrons that have been inelastically scattered as they interact with a thin sample. It yields information on composition and electronic structure but quantification of this information is challenging due to the large dynamic range of the output spectra. Electrons which have lost zero (or very small amounts) of energy saturate the EELS detector whilst inelastically scattered electrons are often hidden in the background spectral noise. An electrostatic fast beam switch (FBS) uses rapid beam blanking to avoid saturation of the detector and allows sequential acquisition of the two signals with an adequate signal to noise ratio. Mor...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Although most of the recent work concerning EELS in electron microscopy is related to instrumental d...
[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and ...
In this thesis, a comprehensive automated quantification process of some of the features in electron...
Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...
© (2008) Dr. Christopher WitteThis thesis explores the theory of electron energy-loss spectroscopy (...
Some aspects of the influence of the energy of the incident electrons in electron energy loss spectr...
Some aspects of the influence of the energy of the incident electrons in electron energy loss spectr...
Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...
This thesis describes the results of an investigation into the design of a parallel recording system...
One of the goals in biology is to relate the ultrastructure with the movement of elements to under s...
Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR sp...
We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS...
Although most of the recent work concerning EELS in electron microscopy is related to instrumental d...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Although most of the recent work concerning EELS in electron microscopy is related to instrumental d...
[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and ...
In this thesis, a comprehensive automated quantification process of some of the features in electron...
Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...
© (2008) Dr. Christopher WitteThis thesis explores the theory of electron energy-loss spectroscopy (...
Some aspects of the influence of the energy of the incident electrons in electron energy loss spectr...
Some aspects of the influence of the energy of the incident electrons in electron energy loss spectr...
Electron energy-loss spectroscopy (EELS) has been investigated in the range from 2 to >10 keV us...
This thesis describes the results of an investigation into the design of a parallel recording system...
One of the goals in biology is to relate the ultrastructure with the movement of elements to under s...
Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR sp...
We discuss various factors that determine the performance of electron energy-loss spectroscopy (EELS...
Although most of the recent work concerning EELS in electron microscopy is related to instrumental d...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
An overview of recent progress in high loss electron energy loss spectroscopy is presented. This cov...
Although most of the recent work concerning EELS in electron microscopy is related to instrumental d...
[eng] In the Transmission Electron Microscope (TEM), an incident electron suffers both elastic and ...