This paper describes the extending model of Multi-mode Failure Models by using the Weibull and Gamma distribution models presented in a conference [1,2]. Different than the models in the previous papers which are for variable test data, in this paper we will describe the use of attribute test data for our model. In reliability theory, the most important problem is to determine the reliability of a complex system from the reliability of its components. The weakness of most reliability theories is that the systems are described and explained as simply functioning or failed. In many real situations, the failures may be from many causes depending upon the age and the environment of the system and its components. Another problem in reliability t...
This research deals with the failure rate of the components of a complex system. The failure of a co...
Over the last few decades, reliability analysis has attracted significant interest due to its import...
Attribute life testing is one way assessing the reliability of a device, in which only the informati...
In reliability theory, the most important problem is to determine the reliability of a complex syste...
In reliability analyses recording the lifetimes of a sample of test units is not always possible, fo...
The development of the theory and application of Monte Carlo Markov Chain methods, vast improvements...
In the reliability modeling field, we sometimes encounter systems with uncertain structures, and the...
An imprecise Bayesian nonparametric approach to system reliability with multiple types of components...
In this paper our effort is to introduce the basic notions that constitute a competing risks models ...
Abstract: This research seeks to better understand how to update sectional time-to-failure (TTF) dis...
In ideal circumstances, failure time data for a K component series system contain the time to failur...
In the masked system lifetime data, the exact component that causes the system's failure is oft...
AbstractAn imprecise Bayesian nonparametric approach to system reliability with multiple types of co...
The exponential distribution is the most widely used reliability analysis. This distribution is very...
In this paper, we propose a comprehensive methodology to specify prior distributions for commonly us...
This research deals with the failure rate of the components of a complex system. The failure of a co...
Over the last few decades, reliability analysis has attracted significant interest due to its import...
Attribute life testing is one way assessing the reliability of a device, in which only the informati...
In reliability theory, the most important problem is to determine the reliability of a complex syste...
In reliability analyses recording the lifetimes of a sample of test units is not always possible, fo...
The development of the theory and application of Monte Carlo Markov Chain methods, vast improvements...
In the reliability modeling field, we sometimes encounter systems with uncertain structures, and the...
An imprecise Bayesian nonparametric approach to system reliability with multiple types of components...
In this paper our effort is to introduce the basic notions that constitute a competing risks models ...
Abstract: This research seeks to better understand how to update sectional time-to-failure (TTF) dis...
In ideal circumstances, failure time data for a K component series system contain the time to failur...
In the masked system lifetime data, the exact component that causes the system's failure is oft...
AbstractAn imprecise Bayesian nonparametric approach to system reliability with multiple types of co...
The exponential distribution is the most widely used reliability analysis. This distribution is very...
In this paper, we propose a comprehensive methodology to specify prior distributions for commonly us...
This research deals with the failure rate of the components of a complex system. The failure of a co...
Over the last few decades, reliability analysis has attracted significant interest due to its import...
Attribute life testing is one way assessing the reliability of a device, in which only the informati...