Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum
- Sliwa, M.
- McGonegle, David
- Wehrenberg, C. E.
- Bolme, C.
- Heighway, Patrick
- Higginbotham, Andrew
- Lazicki, A. E.
- Lee, Hae Ja
- Nagler, Bob
- Park, H. S.
- Rudd, R. E.
- Suggit, Matthew J.
- Swift, D. C.
- Tavella, F.
- Zepeda-Ruiz, L.
- Remington, Bruce A.
- Wark, J S
Publication date
June 2018
DOI Publisher
American Physical Society (APS)Abstract
We have used femtosecond x-ray diffraction (XRD) to study laser-shocked fiber-textured polycrystalline tantalum targets as the 37-253 GPa shock waves break out from the free surface. We extract the time and depth-dependent strain profiles within the Ta target as the rarefaction wave travels back into the bulk of the sample. In agreement with molecular dynamics (MD) simulations the lattice rotation and the twins that are formed under shock-compression are observed to be almost fully eliminated by the rarefaction process
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