A Procedure for Alternate Test Feature Design and Selection
- Barragán Asián, Manuel José
- Léger, Gildas
Publication date
January 2015
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
This paper is a practical illustration of the adoption of alternate tests based upon the judicious selection of the set of parameters to be considered for design as well as to be observed subsequently. The notion of signatures is introduced, and their ability to predict design accuracy is analyzed. The application is demonstrated for an RF LNA circuit.Junta de Andalucía P09-TIC-538
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