Light-beam induced current (LBIC) mapping is an increasingly utilized characterization technique for laboratory-scale as well as industrial-scale solar cells, which measures the local solar cell photocurrent by point illumination. This contribution demonstrates the design and testing of an LBIC mapping device capable of measuring LBIC maps of solar cells using inexpensive materials. With a spatial resolution of 4 μm and an auto-focused beam spot size of about 2 μm, obtained from a standard CD/DVD pickup, high-resolution LBIC maps of thin-film solar cells are obtained. The system was demonstrated by measuring LBIC maps on thin-film solar cells, revealing significant, micrometer-sized photocurrent heterogeneities that are otherwise unseen whe...
Defects buried within a solar cell greatly influence the power output and long-term operation of the...
The LBIC (light beam induced current) method is generally used for detection of local defects in sol...
Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal re...
Laser Beam Induced Current (LBIC) imaging is a nondestructive characterization technique which can b...
Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localiz...
This thesis presents the development of innovative tools to investigate spatially distributed proper...
A laser beam induced current (LBIC) system has been used as a non-destructive characterisation tool ...
The advances in solar technologies has lead higher device conversion efficiency and lower production...
The objective of this study is to characterize and analyse defects in solar cell devices. Materials ...
The presence of inhomogeneities in semiconductor materials used to fabricate solar cell devices may ...
An advanced LBIC measurement for solar cell local characterization, called CELLO has been developed ...
It was studied the Light-Beam-Induced-Current method on thin film solar panels to characterize them....
Semiconductor materials used for making photovoltaic (PV) cells have defects and impurities due to c...
Understanding the performance and aging mechanisms in photovoltaic devices requires a spatial assess...
Abstract:- This work presents a detailed analysis of the LBIC images with visible back side contact....
Defects buried within a solar cell greatly influence the power output and long-term operation of the...
The LBIC (light beam induced current) method is generally used for detection of local defects in sol...
Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal re...
Laser Beam Induced Current (LBIC) imaging is a nondestructive characterization technique which can b...
Light Beam Induced Current (LBIC) measurement is a non-destructive technique used to perform localiz...
This thesis presents the development of innovative tools to investigate spatially distributed proper...
A laser beam induced current (LBIC) system has been used as a non-destructive characterisation tool ...
The advances in solar technologies has lead higher device conversion efficiency and lower production...
The objective of this study is to characterize and analyse defects in solar cell devices. Materials ...
The presence of inhomogeneities in semiconductor materials used to fabricate solar cell devices may ...
An advanced LBIC measurement for solar cell local characterization, called CELLO has been developed ...
It was studied the Light-Beam-Induced-Current method on thin film solar panels to characterize them....
Semiconductor materials used for making photovoltaic (PV) cells have defects and impurities due to c...
Understanding the performance and aging mechanisms in photovoltaic devices requires a spatial assess...
Abstract:- This work presents a detailed analysis of the LBIC images with visible back side contact....
Defects buried within a solar cell greatly influence the power output and long-term operation of the...
The LBIC (light beam induced current) method is generally used for detection of local defects in sol...
Measuring the electrical activity of defects in commercial mc-Si solar cells at micrometric spaal re...