This paper presents an alternative modeling and simulation method for CMOS bridging faults. The significance of the method is the introduction of a set of generic-bridge tables which characterize the bridged outputs for each bridge and a set of generic-cell tables which characterize how each cell propagates a logically undefined input. These two sets of tables are derived dynamically for a specific design by using a SPICE circuit simulator. Then they can be used by any logic fault simulator to simulate bridging faults. In this way, the proposed method can perform very fast bridging fault simulation yet with SPICE accuracy. The paper shows how these two sets of tables are derived and used in a parallel pattern fault simulator. Experimental r...
A new fault simulation framework is proposed for combinational circuits, supported by a detailed ana...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
This paper describes use of a previously proposed test generation program named Jethro to detect the...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
Thls thesis presents an algorithm for fault simulation of metal-oxide-semiconductor (MOS), field-eff...
Mixed analog and digital mode simulators have been available for accurate transient fault simulation...
A new fault simulation framework is proposed for combinational circuits, supported by a detailed ana...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...
This paper presents an alternative modeling and simulation method for CMOS bridging faults. The sign...
This paper introduces a new fault simulation methodology based onsymbolic handling of fault effects....
This paper introduces a new fault simulation methodology based on symbolic handling of fault effects...
104 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1997.Finally, an integrated techni...
In this paper we describe GOLDENGATE - a bridging fault simulator for cell-based digital VLSI circui...
This paper describes use of a previously proposed test generation program named Jethro to detect the...
Imperfections in manufacturing processes may cause unwanted connections (faults) that are added to t...
This dissertation describes a new simulation technique for an automatic test generation system, SCIR...
109 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Fault collapsing, test genera...
Fault simulation is an essential tool for developing test patterns for circuits. Because the potenti...
Thls thesis presents an algorithm for fault simulation of metal-oxide-semiconductor (MOS), field-eff...
Mixed analog and digital mode simulators have been available for accurate transient fault simulation...
A new fault simulation framework is proposed for combinational circuits, supported by a detailed ana...
Trace-based methods have been shown to be more effective than traditional fault simulation methods. ...
[[abstract]]© 2003 Institute of Information Science Academia Sinica - Fault diagnosis that predicts ...