Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high yield. This design methodology produces an integrated circuit which has a big overhead in terms of area and power consumption in most of the cases. In this paper, a new better-than-worst-case-design methodology is proposed. It is based on a timing error speculation technique which features simple monitors located in the critical paths of the circuit that will speculate whether a timing error is going to occur or not. Using a 32-bit multiplier, this design methodology achieved area and power savings up to 50%, with 5 % performance loss
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
[[abstract]]©2008 IEEE-Delay variation can cause a design to fail its timing specification. Ernst in...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
Although today’s the trends of technology scaling is going to bring higher performance computer syst...
The IC industry is facing several major barriers at sub-65nm process nodes due to higher levels of i...
Low-power consumption has become an important aspect of processors and systems design. Many techniqu...
Very-large-scale-integration (VLSI) circuit design heavily relies on computer aided design (CAD) too...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high...
[[abstract]]©2008 IEEE-Delay variation can cause a design to fail its timing specification. Ernst in...
Reliability is an important issue in very large scale integration(VLSI) circuits. In the absence of ...
Although today’s the trends of technology scaling is going to bring higher performance computer syst...
The IC industry is facing several major barriers at sub-65nm process nodes due to higher levels of i...
Low-power consumption has become an important aspect of processors and systems design. Many techniqu...
Very-large-scale-integration (VLSI) circuit design heavily relies on computer aided design (CAD) too...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...
Timing error is now getting increased attention due to the high rate of error-occurrence on ...