This paper presents and compares statistical methods for evaluating the performance of parametric model estimation for insulation lifespan in the case of small size training sets. Parametric models are derived from accelerated aging tests on twisted pairs covered with an insulating varnish under different stress constraints (voltage, frequency and temperature). The estimation of the parametric model coefficients requires some hypothesis on the lifespan statistical distribution. However, since the number of measurements for each configuration is constrained by the experimental cost, the results given by classical goodness-to-fit tests and graphical tools may be questionable. This paper thus proposes to use the bootstrap technique for a more ...
A large amount of parameters related to both operating conditions and material design af...
Sometimes in an experiment, a random number of sample events are observed as opposed to the usual fi...
Electrical failure of insulation is known to be an extremal random process wherein nominally identic...
International audienceThis paper presents and compares statistical methods for evaluating the perfor...
This paper deals with the modeling of insulation material lifespan in a partial discharge regime und...
This paper describes an original statistical approach for the lifespan modeling of electric machine ...
This paper considers the problem of insulation material lifespan modelling. This problem is crucial...
This paper presents and compares different methods for evaluating the relative importance of variabl...
This paper deals with the modeling of insulation material lifespan in a partial discharge regime. Ac...
This paper deals primarily with modeling lifespan and, to a lesser degree, aging in insulation syste...
The aim of this paper is to present a method for modeling the lifespan of insulation materials in a...
International audienceThis paper deals with the modeling of insulation material lifespan in a partia...
In the context of more electric aircrafts, the reliability of the low voltage insulation systems ...
Surface tracking on organic solid insulators is one of the main reasons for failure in high voltage ...
Estimating the useful life of power system components is of considerable importance both in planning...
A large amount of parameters related to both operating conditions and material design af...
Sometimes in an experiment, a random number of sample events are observed as opposed to the usual fi...
Electrical failure of insulation is known to be an extremal random process wherein nominally identic...
International audienceThis paper presents and compares statistical methods for evaluating the perfor...
This paper deals with the modeling of insulation material lifespan in a partial discharge regime und...
This paper describes an original statistical approach for the lifespan modeling of electric machine ...
This paper considers the problem of insulation material lifespan modelling. This problem is crucial...
This paper presents and compares different methods for evaluating the relative importance of variabl...
This paper deals with the modeling of insulation material lifespan in a partial discharge regime. Ac...
This paper deals primarily with modeling lifespan and, to a lesser degree, aging in insulation syste...
The aim of this paper is to present a method for modeling the lifespan of insulation materials in a...
International audienceThis paper deals with the modeling of insulation material lifespan in a partia...
In the context of more electric aircrafts, the reliability of the low voltage insulation systems ...
Surface tracking on organic solid insulators is one of the main reasons for failure in high voltage ...
Estimating the useful life of power system components is of considerable importance both in planning...
A large amount of parameters related to both operating conditions and material design af...
Sometimes in an experiment, a random number of sample events are observed as opposed to the usual fi...
Electrical failure of insulation is known to be an extremal random process wherein nominally identic...