Add to ORKGSRCHewlett-PackardSemiconductor Research Corporation (including SRC member companies Hewlett-Packard and General Electric) / SRC 87-DP-109Ope
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
A new method for hierarchical fault simulation based on multilevel Decision Diagrams (DD) is propose...
This work introduces a new system-level diagnosis model and an algorithm based on this model: Hi-Com...
SRCHewlett-PackardSemiconductor Research Corporation (including SRC member companies Hewlett-Packard...
Test generation at the gate-level produces high-quality tests but is computationally expensive in th...
A unified approach is presented for calculation multi-level testability measures and for testability...
Semiconductor Research Corp. / 91-DP-109NASA / NAG 1-613U of I OnlyRestricted to UIUC communit
Abstract. A new hierarchical modeling and test generation technique for digital circuits is presente...
Abstract—This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HC...
[[abstract]]Integrating reusable cores from multiple sources is essential in system-on-a-chip design...
ISBN: 0818691565A hierarchical test generation method is presented which is based on a functional ap...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Testing complex systems, such as the ASML TWINSCAN lithographic machine, is expensive and time consu...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
A new method for hierarchical fault simulation based on multilevel Decision Diagrams (DD) is propose...
This work introduces a new system-level diagnosis model and an algorithm based on this model: Hi-Com...
SRCHewlett-PackardSemiconductor Research Corporation (including SRC member companies Hewlett-Packard...
Test generation at the gate-level produces high-quality tests but is computationally expensive in th...
A unified approach is presented for calculation multi-level testability measures and for testability...
Semiconductor Research Corp. / 91-DP-109NASA / NAG 1-613U of I OnlyRestricted to UIUC communit
Abstract. A new hierarchical modeling and test generation technique for digital circuits is presente...
Abstract—This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HC...
[[abstract]]Integrating reusable cores from multiple sources is essential in system-on-a-chip design...
ISBN: 0818691565A hierarchical test generation method is presented which is based on a functional ap...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
Testing complex systems, such as the ASML TWINSCAN lithographic machine, is expensive and time consu...
Coordinated Science Laboratory was formerly known as Control Systems LaboratorySemiconductor Researc...
A new method for hierarchical fault simulation based on multilevel Decision Diagrams (DD) is propose...
This work introduces a new system-level diagnosis model and an algorithm based on this model: Hi-Com...