Coordinated Science Laboratory was formerly known as Control Systems LaboratoryJet Propulsion Laboratory / JPL 122991Ope
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
This paper presents a measurement system for research on nonvolatile memories, such as Flash, EPROM...
Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic compon...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
Today's launch vehicles complex electronic and avionic systems heavily utilize the Field Programmabl...
Aim of this work is the description of a test equipment, designed to be integrated on board of a mic...
Field Programmable Gate Arrays (FPGAU's) offer substantial benefits in terms of flexibility and desi...
Les circuits logiques programmables (FPGA) bénéficient des technologies les plus avancés de noeuds C...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Destructive and nondestructive testing, results, and specifications for reliability of integrated ci...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
As we continue to advance in exploring space frontiers, technology must also advance. The need for f...
Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic compon...
Errors within circuits caused by radiation continue to be an important concern to developers. A new ...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
This paper presents a measurement system for research on nonvolatile memories, such as Flash, EPROM...
Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic compon...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
Today's launch vehicles complex electronic and avionic systems heavily utilize the Field Programmabl...
Aim of this work is the description of a test equipment, designed to be integrated on board of a mic...
Field Programmable Gate Arrays (FPGAU's) offer substantial benefits in terms of flexibility and desi...
Les circuits logiques programmables (FPGA) bénéficient des technologies les plus avancés de noeuds C...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Destructive and nondestructive testing, results, and specifications for reliability of integrated ci...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
As we continue to advance in exploring space frontiers, technology must also advance. The need for f...
Field Programmable Gate Arrays (FPGAs) integrated circuits (IC) are one of the key electronic compon...
Errors within circuits caused by radiation continue to be an important concern to developers. A new ...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
This paper presents a measurement system for research on nonvolatile memories, such as Flash, EPROM...