Photoreflectance and electroreflectance from semiconductor surfaces and Surface characterization and surface diffusion measurement by spatial resolution of second harmonic light

Photoreflectance study of surface Fermi level in GaAs and GaAlAs

Shen, H.
Dutta, M.
Fotiadis, L.
Newman, P. G.
Moerkirk, R. P.
Chang, W. H.
Sacks, R. N.

January 1990

Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...

Surface studies of semiconducting surfaces

Jewik, Patrick

January 1989

Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...

A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate

Jin P (Jin Peng)
Pan SH (Pan S. H.)
Li YG (Li Y. G.)
Zhang CZ (Zhang C. Z.)
Wang ZG (Wang Z. G.)
Jin, P, Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. E-mail: pengjin@red.semi.ac.cn

January 2006

Contactless electroreflectance (CER) and photoreflectance (PR) measurements have been performed on s...

Photoreflectance and electroreflectance from semiconductor surfaces and Surface characterization and surface diffusion measurement by spatial resolution of second harmonic light

Jackson, Philip Lawrence

January 1990

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...

Photoreflectance technique of semiconductor surfaces

Udarbe, Rouema M.

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

ELECTROREFLECTANCE IN SURFACE PHYSICS

B. O. SERAPHIN

January 1970

Periodic modulation of the potential barrier inside the reflecting surface of a semiconductor result...

The computer modelling on semiconductor experiment study of photoreflectance

Chiu, Frank Te Yang

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

Interference effects in photoreflectance of epitaxial layers grown on semi-insulating substrates

Lipsanen, Harri
Airaksinen, V. M.

January 1993

Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...

Comparison between optical techniques for the measurement of the surface electric field in (100) oriented GaAs

Yang, Z
Chen, YH
Wong, YQ

January 1998

Three optical spectroscopic techniques commonly used for the measurement of the surface electric fie...

Photoellipsometry determination of surface Fermi level in GaAs (100)

Xiong, Yi-Ming
Snyder, Paul G.
Woollam, John A.

July 1993

Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...

Data reduction and analysis software for surface study techniques

Dopudja, Biljana M.

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

Optical Rectification at Semiconductor Surfaces

Chuang, Shun Lien
Schmitt-Rink, Stefan
Greene, Benjamin I.
Saeta, Peter N.
Levi, Anthony F. J.

January 1992

We show that far-infrared radiation can be generated in the depletion field near semiconductor surfa...

ELECTROREFLECTANCE

B. O. SERAPHIN

Electroreflectance is the oldest of a growing number of differential reflectance techniques which fo...

A study of GaAs(100) using photoreflectance

Beelendorf, Phil

January 10000

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1991.Includes b...

Photoreflectance analysis of MQWs in intermediate electric field regime

Geddo, M
DiLernia, S
Chen, CJ

January 1996

Photoreflectance spectra of MBE grown GaAs-AlGaAs MQWs in an intermediate electric field regime are ...

Photoreflectance study of surface Fermi level in GaAs and GaAlAs

Shen, H.
Dutta, M.
Fotiadis, L.
Newman, P. G.
Moerkirk, R. P.
Chang, W. H.
Sacks, R. N.

January 1990

Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...

Surface studies of semiconducting surfaces

Jewik, Patrick

January 1989

Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...

A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate

Jin P (Jin Peng)
Pan SH (Pan S. H.)
Li YG (Li Y. G.)
Zhang CZ (Zhang C. Z.)
Wang ZG (Wang Z. G.)
Jin, P, Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. E-mail: pengjin@red.semi.ac.cn

January 2006

Contactless electroreflectance (CER) and photoreflectance (PR) measurements have been performed on s...

Photoreflectance and electroreflectance from semiconductor surfaces and Surface characterization and surface diffusion measurement by spatial resolution of second harmonic light

Jackson, Philip Lawrence

January 1990

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...

Photoreflectance technique of semiconductor surfaces

Udarbe, Rouema M.

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

ELECTROREFLECTANCE IN SURFACE PHYSICS

B. O. SERAPHIN

January 1970

Periodic modulation of the potential barrier inside the reflecting surface of a semiconductor result...

The computer modelling on semiconductor experiment study of photoreflectance

Chiu, Frank Te Yang

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

Interference effects in photoreflectance of epitaxial layers grown on semi-insulating substrates

Lipsanen, Harri
Airaksinen, V. M.

January 1993

Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...

Comparison between optical techniques for the measurement of the surface electric field in (100) oriented GaAs

Yang, Z
Chen, YH
Wong, YQ

January 1998

Three optical spectroscopic techniques commonly used for the measurement of the surface electric fie...

Photoellipsometry determination of surface Fermi level in GaAs (100)

Xiong, Yi-Ming
Snyder, Paul G.
Woollam, John A.

July 1993

Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...

Data reduction and analysis software for surface study techniques

Dopudja, Biljana M.

January 1989

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...

Optical Rectification at Semiconductor Surfaces

Chuang, Shun Lien
Schmitt-Rink, Stefan
Greene, Benjamin I.
Saeta, Peter N.
Levi, Anthony F. J.

January 1992

We show that far-infrared radiation can be generated in the depletion field near semiconductor surfa...

ELECTROREFLECTANCE

B. O. SERAPHIN

Electroreflectance is the oldest of a growing number of differential reflectance techniques which fo...

A study of GaAs(100) using photoreflectance

Beelendorf, Phil

January 10000

Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1991.Includes b...

Photoreflectance analysis of MQWs in intermediate electric field regime

Geddo, M
DiLernia, S
Chen, CJ

January 1996

Photoreflectance spectra of MBE grown GaAs-AlGaAs MQWs in an intermediate electric field regime are ...

Photoreflectance study of surface Fermi level in GaAs and GaAlAs

Shen, H.
Dutta, M.
Fotiadis, L.
Newman, P. G.
Moerkirk, R. P.
Chang, W. H.
Sacks, R. N.

January 1990

Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the el...

Surface studies of semiconducting surfaces

Jewik, Patrick

January 1989

Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...

A comparison between contactless electroreflectance and photoreflectance spectra from n-doped GaAs on a semi-insulating GaAs substrate

Jin P (Jin Peng)
Pan SH (Pan S. H.)
Li YG (Li Y. G.)
Zhang CZ (Zhang C. Z.)
Wang ZG (Wang Z. G.)
Jin, P, Chinese Acad Sci, Key Lab Semicond Mat Sci, Inst Semicond, POB 912, Beijing 100083, Peoples R China. E-mail: pengjin@red.semi.ac.cn

January 2006

Contactless electroreflectance (CER) and photoreflectance (PR) measurements have been performed on s...

Photoreflectance and electroreflectance from semiconductor surfaces and Surface characterization and surface diffusion measurement by spatial resolution of second harmonic light

Abstract

Extracted data

Photoreflectance and electroreflectance from semiconductor surfaces and Surface characterization and surface diffusion measurement by spatial resolution of second harmonic light

Abstract

Extracted data

Related items

Related items