Add to ORKGThesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes bibliographical references (leaf 11)Microfiche of typescript. [Urbana, Ill.]: Photographic Services, University of Illinois, U of I Library, [1989]. 1 microfiche (37 frames): negative.s 1989 ilu n
In this review, we present the photoreflectance (PR) spectroscopy as a powerful tool for investiga-t...
Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...
In this work we used reflectance microscopy to investigate biased metal-oxide - semiconductor field-...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1991.Includes b...
Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...
Thesis (B.S.) in Chemistry -- University of Illinois at Urbana-Champaign, 1988.Bibliography: leaves ...
Photoreflectance (PR) is a convenient characterization tool able to reveal optoelectronic properties...
It is presented a biographic revision of the photoreflectance technique (PR) since its theoretical f...
A photoreflectance measurement system has been designed and implemented. The system provides a sensi...
In this review, we present the photoreflectance (PR) spectroscopy as a powerful tool for investiga-t...
Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...
In this work we used reflectance microscopy to investigate biased metal-oxide - semiconductor field-...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1990.Includes b...
Thesis (B.S.) in Liberal Arts and Sciences -- University of Illinois at Urbana-Champaign, 1989.Inclu...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1989.Includes b...
Thesis (B.S.) in Chemical Engineering -- University of Illinois at Urbana-Champaign, 1991.Includes b...
Photoellipsometry, a new contactless optical method, is presented, Related to photoreflectance, this...
Thesis (B.S.) in Chemistry -- University of Illinois at Urbana-Champaign, 1988.Bibliography: leaves ...
Photoreflectance (PR) is a convenient characterization tool able to reveal optoelectronic properties...
It is presented a biographic revision of the photoreflectance technique (PR) since its theoretical f...
A photoreflectance measurement system has been designed and implemented. The system provides a sensi...
In this review, we present the photoreflectance (PR) spectroscopy as a powerful tool for investiga-t...
Interferences were observed in the photoreflectance spectra of homoepitaxial layers grown on semi‐in...
In this work we used reflectance microscopy to investigate biased metal-oxide - semiconductor field-...