Predicting CMOS Hot Carrier Degradation in VLSI Circuits

91 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1999.Reliability simulation of a 51-stage ring-oscillator was performed. The circuit lifetime improvement due to D2 anneal can be well estimated by the device dc lifetime improvement data.U of I OnlyRestricted to the U of I community idenfinitely during batch ingest of legacy ETD