97 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2002.We present a simulator-independent compact model of a vertical npn transistor suitable for ESD circuit simulation. In addition to modeling accurately the high-current and breakdown effects, we also model accurately the small-signal off-state impedance of the device using s-parameter measurements, for inclusion in RF circuit simulations. Experimental results are provided for silicon and SiGe npn transistors.U of I OnlyRestricted to the U of I community idenfinitely during batch ingest of legacy ETD
We present the results of extensive characterization of fully isolated SOI NPN bipolar protection de...
In this paper, we propose a circuit modeling technique for the ISO 10605 field-coupled electrostatic...
[[abstract]]Reliabilities of semiconductor devices become more concerned issues in modern semiconduc...
9 pagesInternational audienceA thorough analysis of the physical mechanisms involved in a Vertical G...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004.In this dissertation, extensi...
A modeling technique has been developed which simulates a semiconductor device subjected to electros...
To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment u...
This dissertation describes several studies regarding the effects of system-level electrostatic disc...
In this work high-voltage Electrostatic discharge (ESD) PNPs are studied through TCAD simulation and...
This thesis presents a methodology to model and simulate transient electrostatic discharge (ESD) res...
Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents ...
An electrostatic discharge (ESD) is a spontaneous electrical current that flows between two objects ...
In this work, we have developed and implemented a robust TCAD simulator in the optimization of devic...
ESD generators are widely used for testing the robustness of electronic equipment against human elec...
[[abstract]]With the rapid progress of electronic products, ESD (Electro-Static Discharge, ESD) is o...
We present the results of extensive characterization of fully isolated SOI NPN bipolar protection de...
In this paper, we propose a circuit modeling technique for the ISO 10605 field-coupled electrostatic...
[[abstract]]Reliabilities of semiconductor devices become more concerned issues in modern semiconduc...
9 pagesInternational audienceA thorough analysis of the physical mechanisms involved in a Vertical G...
142 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004.In this dissertation, extensi...
A modeling technique has been developed which simulates a semiconductor device subjected to electros...
To enable accurate system-level electrostatic discharge (ESD) simulation, models for the equipment u...
This dissertation describes several studies regarding the effects of system-level electrostatic disc...
In this work high-voltage Electrostatic discharge (ESD) PNPs are studied through TCAD simulation and...
This thesis presents a methodology to model and simulate transient electrostatic discharge (ESD) res...
Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents ...
An electrostatic discharge (ESD) is a spontaneous electrical current that flows between two objects ...
In this work, we have developed and implemented a robust TCAD simulator in the optimization of devic...
ESD generators are widely used for testing the robustness of electronic equipment against human elec...
[[abstract]]With the rapid progress of electronic products, ESD (Electro-Static Discharge, ESD) is o...
We present the results of extensive characterization of fully isolated SOI NPN bipolar protection de...
In this paper, we propose a circuit modeling technique for the ISO 10605 field-coupled electrostatic...
[[abstract]]Reliabilities of semiconductor devices become more concerned issues in modern semiconduc...