There is continual motivation to scale down transistors size and to reduce the supply voltage of the circuits. However, by approaching the limits of transistor scaling and operating at a minimal supply voltage, circuit reliability has emerged as a critical concern. Circuits become more and more susceptible to errors due to Process, Voltage and Temperature (PVT) variations. Occurrence of errors can affect the behavior of circuits and generate a permanent system failure. Therefore, it is increasingly important to deal with errors effects in order to keep future devices working properly. The objective of the thesis is to address the reliability in digital systems and introduce new fault tolerant techniques to perform reliable signal processing...