Layer Thickness Measurement

This thesis describe method for layer thickness measurement for metallic and nonmetallic materials. Describe problems of these methods and their physical principles. Thesis deal with the newest technologies (SIDSP), which take the place of analog measuring systems using magnetic induction technique and inductive gaging technique. Thesis contains initiatives of destructive microscopic technique, nondestructive ultrasounds methods and their compare. In the end of the project is decribed experimental layer thickness measurement and its statistical process