Failure rate data for Apollo Lunar Surface Experiments Package

This ATM now includes failure rate data on Unitrode and Isofilm diodes and TTL integrated circuits. Also, the integrated circuit failure rate is now a function of temperature. A lunar standby K factor has been added and minor changes have been made to all failure rate charts. Appendix A, Reliability Mathematics and Methods has also been added.prepared by F. L. Howell, R. J. Dallaire.Introduction -- Array E environment and K factors -- Array E derating criteria -- Failure modes apportionment -- Component failure rates -- Reliability mathematics and methods.Revision no.