We have compared the atomic-scale structure of ion irradiated GaN to that of amorphised GaP and GaAs. While continuous and homogenous amorphised layers were easily achieved in GaP and GaAs, ion irradiation of GaN yielded both structural and chemical inhomogeneities. Transmission electron microscopy revealed GaN crystallites and N2 bubbles were interspersed within an amorphous GaN matrix. The crystallite orientation was random relative to the unirradiated epitaxial structure, suggesting their formation was irradiation-induced, while the crystallite fraction was approximately constant for all ion fluences beyond the amorphisation threshold, consistent with a balance between amorphisation and recrystallisation processes. Extended X-ray absorpt...
Wurtzite GaN films irradiated at room temperature with 308 MeV 129Xe35+ or 230 MeV 208Pb27+ ions hav...
The effects of elevated-temperature ion bombardment of wurtzite GaN films preamorphized by ion impla...
Wurtzite GaN epilayers irradiated at room temperature with 308 MeV (129)Xe(35+) ions to fluences of ...
Structural studies reveal that heavy ion bombardment of GaN causes amorphization and anomalous swell...
Damage and microstructure evolution in gallium nitride (GaN) under Au(+) ion irradiation has been in...
The effects of elevated-temperature ion bombardment of wurtzite GaN films preamorphized by ion impla...
The damage buildup until amorphization in wurtzite GaN films under kev light (12C) and heavy (197Au)...
This paper deals with the results of a systematic investigation of damage generation and accumulatio...
A surface amorphized layer and a buried disordered structure were created in gallium nitride (GaN) i...
International audienceThe widespread adoption of gGaN in radiation-hard semiconductor devices relies...
GaN epilayers grown by metal organic chemical vapor deposition (MOCVD) were implanted with Tm and Eu...
The radiation damage formation upon low temperature ion implantation and neutron irradiation has bee...
Surface damage of gallium nitride films irradiated by Arq+ (6 ≤ q ≤ 16) ions at room temperature is s...
The structural characteristics of wurtzite GaN films bombarded up to high ion doses are studied by a...
Wurtzite GaN can be rendered amorphous by high-dose heavy-ion bombardment. We show here that relativ...
Wurtzite GaN films irradiated at room temperature with 308 MeV 129Xe35+ or 230 MeV 208Pb27+ ions hav...
The effects of elevated-temperature ion bombardment of wurtzite GaN films preamorphized by ion impla...
Wurtzite GaN epilayers irradiated at room temperature with 308 MeV (129)Xe(35+) ions to fluences of ...
Structural studies reveal that heavy ion bombardment of GaN causes amorphization and anomalous swell...
Damage and microstructure evolution in gallium nitride (GaN) under Au(+) ion irradiation has been in...
The effects of elevated-temperature ion bombardment of wurtzite GaN films preamorphized by ion impla...
The damage buildup until amorphization in wurtzite GaN films under kev light (12C) and heavy (197Au)...
This paper deals with the results of a systematic investigation of damage generation and accumulatio...
A surface amorphized layer and a buried disordered structure were created in gallium nitride (GaN) i...
International audienceThe widespread adoption of gGaN in radiation-hard semiconductor devices relies...
GaN epilayers grown by metal organic chemical vapor deposition (MOCVD) were implanted with Tm and Eu...
The radiation damage formation upon low temperature ion implantation and neutron irradiation has bee...
Surface damage of gallium nitride films irradiated by Arq+ (6 ≤ q ≤ 16) ions at room temperature is s...
The structural characteristics of wurtzite GaN films bombarded up to high ion doses are studied by a...
Wurtzite GaN can be rendered amorphous by high-dose heavy-ion bombardment. We show here that relativ...
Wurtzite GaN films irradiated at room temperature with 308 MeV 129Xe35+ or 230 MeV 208Pb27+ ions hav...
The effects of elevated-temperature ion bombardment of wurtzite GaN films preamorphized by ion impla...
Wurtzite GaN epilayers irradiated at room temperature with 308 MeV (129)Xe(35+) ions to fluences of ...