Ion-Irradiation-Induced Preferential Amorphization of Ge Nanocrystals in Silica
- Ridgway, Mark C
- Azevedo, G de M
- Elliman, Robert
- Glover, Christopher
- Llewellyn, David
- Miller, R
- Wesch, W
- Foran, Garry J
- Hansen, Jeffrey
- Nylandsted-Larsen, A
Publication date
December 2015
DOI Publisher
American Physical Society Journal
issn:1098-0121Abstract
Extended x-ray absorption fine structure (EXAFS) measurements have been used to characterize the ion-irradiation-induced crystalline-to-amorphous phase transformation in Ge nanocrystals. The atomic-scale structure of Ge nanocrystals in a silica matrix i
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