Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO[sub 2]

Au nanocrystals (NCs) fabricated by ion implantation into thin SiO₂ and annealing were investigated by means of extended x-rayabsorption fine structure (EXAFS)spectroscopy and transmission electron microscopy. A bond length contraction was observed and can be explained by surface tension effects in a simple liquid-drop model. Such results are consistent with previous reports on nonembedded NCs implying a negligible influence of the SiO₂ matrix. Cumulant analysis of the EXAFS data suggests surface reconstruction or relaxation involving a further shortened bond length. A deviation from the octahedral closed shell structure is apparent for NCs of size 25Å.P. K. is grateful to the Humboldt Foundation in Germany for support. P.K., B.J., A.C., C.J.G., G.d.M.A., G.J.F., and M.C.R. were supported by the Australian Synchrotron Research Program