Spring constant calibration of atomic force microscope cantilevers of arbitrary shape
- Sader, J
- Sanelli, J
- Adamson, B
- Monty, J
- Wei, X
- Crawford, S
- Friend, J
- Marusic, I
- Mulvaney, P
- Bieske, E
Publication date
January 2012
DOI Publisher
American Institute of Physics (United States) ISSN
0034-6748 Citation count (estimate)
1193Abstract
The spring constant of an atomic force microscope cantilever is often needed for quantitative measurements. The calibration method of Sader et al. [Rev. Sci. Instrum. 70, 3967 (1999)] for a rectangular cantilever requires measurement of the resonant frequency and quality factor in fluid (typically air), and knowledge of its plan view dimensions
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