We present a Silicon-on-Insulator based circuit for use as configuration storage in a radiation hard reconfigurable system. A non-volatile storage cell, manufacturable in a standard single polysilicon SOI CMOS process with no special layers, is combined with a Schmitt sense amplifier such that the overall block exhibits two unique characteristics that enhance its resistance to radiation induced upsets. Firstly, it is impossible for a radiation-induced event to permanently flip the configuration state. Secondly, a partial de-programming resulting in a reduction in the magnitude of the storage cell voltage causes a large change in static current that can be very easily detected using a conventional sense amplifier. A memory correction (scrubb...
We investigated the heavy ion single-event effect (SEE) susceptibility of the industrys first stand-...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
We present a Silicon-on-Insulator based Look-up Table and configuration memory for application withi...
We describe and analyze a non-volatile configuration memory system with high resistance to radiation...
Defects in silicon-on-insulator (SOI) buried oxides are normally considered deleterious to device op...
Advantages in transient ionizing and single-event upset (SEU) radiation hardness of silicon-on-insul...
Once entirely the domain of space-borne applications, the effects of high energy charged particles ...
Static RAM-based field programmable gate arrays (SRAM-based FPGAs) are widely adopted in t...
The usage of static random access memory-based field programmable gate arrays (FPGAs) on high-energy...
A new flash EEPROM cell and a novel erasing scheme on SOI substrates are reported. This flash EEPROM...
The total ionizing dose (TID) effects on single-event upset (SEU) hardness are investigated for two ...
Static random access memory (SRAM) is one the most sensitive devices to radiation. It may often exhi...
Single-event upset (SEU) hardness varies across dies, wafers, and lots—even just after fabrication a...
The traditional use of SOI CMOS has been in the development of radiation-hardened integrated circuit...
We investigated the heavy ion single-event effect (SEE) susceptibility of the industrys first stand-...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
We present a Silicon-on-Insulator based Look-up Table and configuration memory for application withi...
We describe and analyze a non-volatile configuration memory system with high resistance to radiation...
Defects in silicon-on-insulator (SOI) buried oxides are normally considered deleterious to device op...
Advantages in transient ionizing and single-event upset (SEU) radiation hardness of silicon-on-insul...
Once entirely the domain of space-borne applications, the effects of high energy charged particles ...
Static RAM-based field programmable gate arrays (SRAM-based FPGAs) are widely adopted in t...
The usage of static random access memory-based field programmable gate arrays (FPGAs) on high-energy...
A new flash EEPROM cell and a novel erasing scheme on SOI substrates are reported. This flash EEPROM...
The total ionizing dose (TID) effects on single-event upset (SEU) hardness are investigated for two ...
Static random access memory (SRAM) is one the most sensitive devices to radiation. It may often exhi...
Single-event upset (SEU) hardness varies across dies, wafers, and lots—even just after fabrication a...
The traditional use of SOI CMOS has been in the development of radiation-hardened integrated circuit...
We investigated the heavy ion single-event effect (SEE) susceptibility of the industrys first stand-...
Heavy charged particle induced soft errors in semiconductor memory devices have been a field failure...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...