Test analysis of ion-implanted PIN radiation detectors

We have developed ion-implanted PIN radiation detectors with five kinds of thickness by advanced microelectronic and micromechanical technology. Among them, three types with thickness of 300 ??m, 450 ??m, and 1000 ??m are chosen to do test experiments of the leak current, noise, and energy resolution. The results show that our PIN detectors are of good performances compatible to ORTEC detectors. Under 25.7??C environment temperature, the average leak current is 14 nA, the noise is 7.4 keV, and the resolution is 16.9 keV. The resolution may have the room to be improved since the noise is lower than ORTEC detectors.EI05457-4602