Study of field emission from single-walled carbon nanotubes using probe-hole method

A probe-hole Field Emission Microscope (FEM) features the capability of measuring the respective dependence of local and total field emission currents on applied voltage. A FEM equipped with a probe-hole, which could be submitted to two-dimensional motion, was employed to acquire curves of field emission current versus applied voltage of single-walled carbon nanotubes (SWCNTs). The field emission currents were acquired from different regions and different adsorption states. Furthermore, the influence of heat treatment on current-voltage behaviors of the SWCNTs was also studied.EI0111623-16253