Study on crystal defects in synthetic diamond with synchrotron radiation x-ray diffraction topography

Crystal defects in a synthetic diamond were studied by synchrotron radiation X-ray diffraction topography, including projection (Laue) and surface reflection topographies. Most of those diffraction spots on the Laue X-ray pattern of the synthetic diamond are distributed on four main crystal zones respectively. The main type of crystal defects in this sample are dislocations, and some of them belong to the Frank type. It shows that dislocations in the surface reflection topography distribute in a networks, which can reveal faults in the surface more than that inside. Further more, by analyzing and comparing the topographs it derives that the amount of the crystal defects in the synthetic diamond are obviously less than those in the natural diamond.EI0133-373