One should pay attention to quite a lot of factors when the emittance of high-current ion beam is measured. The background subtraction and threshold setting, the measuring method of pulsed beam emittance, as well as the error sources in the emittance measurements and its elimination or correction are discussed based on the experience during the R&D of three emittance measurement units for high-current ion beams at Peking University.http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000255855900048&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701Physics, NuclearPhysics, Particles & FieldsSCI(E)1148-1503
A new concept to attain ion beam emittance through measuring the forward neutral beam without interc...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Several complementary transverse emittance monitors have been developed and used at the Fermilab acc...
A high-current ion beam emittance measurement unit (EMU) is introduced in the paper. The measurement...
A high-current ion beam emittance measurement unit (EMU) based on slit-wire method was introduced. T...
强流离子束的发射度测量与弱流相比有很多需要特殊考虑之处.介绍了北京大学先后研制的三台强流离子束发射度测量仪所采用的测量和数据处理方法,包括本底扣除和阈值设置、强流脉冲束的测量方法、误差的主要来源及其控...
Three sets of High Intensity Beam Emittance Measurement Units (HIBEMUs) are being developed at Pekin...
To measure the emittance of a 2 MeV 40 mA pulsed D+ ion beam with the repeat frequency of 100 Hz and...
Three sets of High Intensity Beam Emittance Measurement Units (HIBEMUs) are being developed at Pekin...
The determination of the beam emittance using conventional destructive methods suffers from two main...
Sweep plate scanners are preferred for emittance measurement due to their versatility, simplicity, a...
The emittance of an extracted ion beam can be estimated to first order by a series of three linear i...
Beam emittance is one of the most important parameters for electron sources. To investigate the beam...
The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench...
The determination of the beam emittance using conventional destructive methods suffers from two main...
A new concept to attain ion beam emittance through measuring the forward neutral beam without interc...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Several complementary transverse emittance monitors have been developed and used at the Fermilab acc...
A high-current ion beam emittance measurement unit (EMU) is introduced in the paper. The measurement...
A high-current ion beam emittance measurement unit (EMU) based on slit-wire method was introduced. T...
强流离子束的发射度测量与弱流相比有很多需要特殊考虑之处.介绍了北京大学先后研制的三台强流离子束发射度测量仪所采用的测量和数据处理方法,包括本底扣除和阈值设置、强流脉冲束的测量方法、误差的主要来源及其控...
Three sets of High Intensity Beam Emittance Measurement Units (HIBEMUs) are being developed at Pekin...
To measure the emittance of a 2 MeV 40 mA pulsed D+ ion beam with the repeat frequency of 100 Hz and...
Three sets of High Intensity Beam Emittance Measurement Units (HIBEMUs) are being developed at Pekin...
The determination of the beam emittance using conventional destructive methods suffers from two main...
Sweep plate scanners are preferred for emittance measurement due to their versatility, simplicity, a...
The emittance of an extracted ion beam can be estimated to first order by a series of three linear i...
Beam emittance is one of the most important parameters for electron sources. To investigate the beam...
The new test-bench for heavy ion sources has been created in ITEP. It is planned to equip test-bench...
The determination of the beam emittance using conventional destructive methods suffers from two main...
A new concept to attain ion beam emittance through measuring the forward neutral beam without interc...
Advanced diagnostic tools for high brightness electron beams are mandatory for the proper optimizati...
Several complementary transverse emittance monitors have been developed and used at the Fermilab acc...