In this work, a comprehensive analysis is performed to study the speed-power performance of one selector-one resistor (1S-1R) and one transistor-one resistor (1T-1R) resistive random access memory (RRAM) arrays, using a physics-based SPICE model of RRAM. It is found that for 1S-1R applications, high turn-on voltage and low conductivity of selectors are beneficial for power reduction, while low turn-on voltage and high conductivity are required for high-speed applications. High nonlinearity of selectors is critical for both low-power and high-speed 1S-1R applications. For 1T-1R arrays, interconnect RC components will impact energy consumption and RC delay, which may set a major limitation to high-speed low-power RRAM applications. ? 2014 IEE...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
With the continuous scaling of transistor devices reaching their physical limits, emerging non-volat...
With the increasing demand for high-density, low-cost, high-speed and low-power nonvolatile memory (...
The resistive random access memory (RRAM) crossbar array has been extensively studied as one of the ...
Leakage current suppression ability of threshold switching selectors is important for the high-densi...
A physical-based simplified model is presented to quantify the resistive switching behavior of oxide...
Resistive switching random access memory (RRAM) is a leading candidate for next-generation nonvolati...
Resistive switching random access memory (RRAM) is a leading candidate for next-generation nonvolati...
As modern electronics have started to reach its physical scaling limits, novel architectures and phy...
In this paper, the physical mechanism and models of oxide-based resistive-switching random access me...
A SPICE model of oxide-based resistive random access memory (RRAM) for dc and transient behaviors is...
Resistive switching (RS) devices are emerging electronic components that could have applications in ...
abstract: Resistive Random Access Memory (RRAM) is an emerging type of non-volatile memory technolog...
In this paper a compact model both for bipolar and unipolar resistive switching device is proposed. ...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
With the continuous scaling of transistor devices reaching their physical limits, emerging non-volat...
With the increasing demand for high-density, low-cost, high-speed and low-power nonvolatile memory (...
The resistive random access memory (RRAM) crossbar array has been extensively studied as one of the ...
Leakage current suppression ability of threshold switching selectors is important for the high-densi...
A physical-based simplified model is presented to quantify the resistive switching behavior of oxide...
Resistive switching random access memory (RRAM) is a leading candidate for next-generation nonvolati...
Resistive switching random access memory (RRAM) is a leading candidate for next-generation nonvolati...
As modern electronics have started to reach its physical scaling limits, novel architectures and phy...
In this paper, the physical mechanism and models of oxide-based resistive-switching random access me...
A SPICE model of oxide-based resistive random access memory (RRAM) for dc and transient behaviors is...
Resistive switching (RS) devices are emerging electronic components that could have applications in ...
abstract: Resistive Random Access Memory (RRAM) is an emerging type of non-volatile memory technolog...
In this paper a compact model both for bipolar and unipolar resistive switching device is proposed. ...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
A methodology to analyze device-to-circuit characteristics and predict memory array performance is p...
With the continuous scaling of transistor devices reaching their physical limits, emerging non-volat...