Based on the new finding on switching behavior, for the first time a new memory operation principle is proposed to control the switching and to achieve improved performance of oxide-based RRAM including device-to-device and cycle-to-cycle uniformity, RESET current, and window of RHRS/RLRS ratio. Furthermore, a numerical simulation method is developed to evaluate the validity of the new operation principle in scaled RRAM devices.EI
A novel strategy based on defect engineering is proposed for high-performance multilevel data storag...
This thesis introduces fabrication and physical as well as electrical characterizations of oxide-bas...
This paper presents a unified physical mechanism of TMO-RRAM to elucidate unipolar and bipolar resis...
In this paper, the physical mechanism and models of oxide-based resistive-switching random access me...
Resistive switching behaviors of oxide-based resistive random access memory (RRAM) and the applicati...
A unified microscopic principle is proposed to clarify resistive switching behaviors of transition m...
Resistive random access memory (RRAM or ReRAM) is a non-volatile memory (NVM) technology that consum...
Oxide-based resistive random access memory(RRAM) has been widely studied as the promising candidate ...
Memory has always been a building block element for information technology. Emerging technologies su...
Resistance change memory (RRAM) based on transition metal oxides (TMO), whose operation is based on ...
New physical insights on the underlying physics from switching behaviors to operating mechanisms of ...
A physical-based simplified model is presented to quantify the resistive switching behavior of oxide...
For the first time, a new technical solution is presented to essentially improve the uniformity of o...
Excellent bipolar resistive switching (RS) behavior was achieved in TiN/ZnO/Pt resistive random acce...
This paper presents a unified physical model to elucidate the resistive switching behavior of metal-...
A novel strategy based on defect engineering is proposed for high-performance multilevel data storag...
This thesis introduces fabrication and physical as well as electrical characterizations of oxide-bas...
This paper presents a unified physical mechanism of TMO-RRAM to elucidate unipolar and bipolar resis...
In this paper, the physical mechanism and models of oxide-based resistive-switching random access me...
Resistive switching behaviors of oxide-based resistive random access memory (RRAM) and the applicati...
A unified microscopic principle is proposed to clarify resistive switching behaviors of transition m...
Resistive random access memory (RRAM or ReRAM) is a non-volatile memory (NVM) technology that consum...
Oxide-based resistive random access memory(RRAM) has been widely studied as the promising candidate ...
Memory has always been a building block element for information technology. Emerging technologies su...
Resistance change memory (RRAM) based on transition metal oxides (TMO), whose operation is based on ...
New physical insights on the underlying physics from switching behaviors to operating mechanisms of ...
A physical-based simplified model is presented to quantify the resistive switching behavior of oxide...
For the first time, a new technical solution is presented to essentially improve the uniformity of o...
Excellent bipolar resistive switching (RS) behavior was achieved in TiN/ZnO/Pt resistive random acce...
This paper presents a unified physical model to elucidate the resistive switching behavior of metal-...
A novel strategy based on defect engineering is proposed for high-performance multilevel data storag...
This thesis introduces fabrication and physical as well as electrical characterizations of oxide-bas...
This paper presents a unified physical mechanism of TMO-RRAM to elucidate unipolar and bipolar resis...