The dependences of series resistance, ideality factor, and junction voltage of light-emitting diodes (LEDs) on applied voltage or current were characterized accurately using alternating current (ac) behavior combined with I-V plot (ac IV method). The deep saturation of junction voltage and simultaneous decrease of ideality factor of LEDs at large forward current, which imply the pinning of quasi-Fermi levels, were observed. Comparing with our recent study of the similar phenomenon of laser diodes, in which the junction voltage jumps abruptly to a saturated value at lasing threshold, the changes of junction voltage of LEDs are gradual. In addition, the decrease of series resistance with the increasing current and the negative capacitance eff...
In GaAs-based light-emitting diode (LED) or laser diode (LD), the forward voltage (V) will decrease ...
The forward voltage for single-die high-power light-emitting diodes (LEDs) driven at currents within...
In addition, the authors discuss the charge distribution conditions in the depleted region of a line...
Measurement of obvious negative capacitance (NC) at large forward bias of light-emitting diodes (LED...
The capacitance characteristics of light emitting diodes (LEDs) are accurately measured using a meth...
From analyzing the discontinuous electrical behaviors of laser diodes(LDs) at lasing threshold in de...
This paper shows that the junction temperature and input and output power of light-emitting diodes (...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Optical and electrical characteristics of power light-emitting diodes (LEDs) are strongly dependent ...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
At large forward bias voltage, the accurate electrical properties of semiconductor GaN-based blue li...
Current-voltage (I-V) characteristics of GaN-based high power flip-chip blue LEDs were measured at d...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
The negative capacitance behavior in light-emitting diodes and laser diodes has been observed and ch...
Saturation of the junction voltage in GaN-based laser diodes (LDs) is studied. It is found that ther...
In GaAs-based light-emitting diode (LED) or laser diode (LD), the forward voltage (V) will decrease ...
The forward voltage for single-die high-power light-emitting diodes (LEDs) driven at currents within...
In addition, the authors discuss the charge distribution conditions in the depleted region of a line...
Measurement of obvious negative capacitance (NC) at large forward bias of light-emitting diodes (LED...
The capacitance characteristics of light emitting diodes (LEDs) are accurately measured using a meth...
From analyzing the discontinuous electrical behaviors of laser diodes(LDs) at lasing threshold in de...
This paper shows that the junction temperature and input and output power of light-emitting diodes (...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
Optical and electrical characteristics of power light-emitting diodes (LEDs) are strongly dependent ...
Temperature-dependent ac current-voltage-capacitance characteristics between 90 K and 440 K were inv...
At large forward bias voltage, the accurate electrical properties of semiconductor GaN-based blue li...
Current-voltage (I-V) characteristics of GaN-based high power flip-chip blue LEDs were measured at d...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
The negative capacitance behavior in light-emitting diodes and laser diodes has been observed and ch...
Saturation of the junction voltage in GaN-based laser diodes (LDs) is studied. It is found that ther...
In GaAs-based light-emitting diode (LED) or laser diode (LD), the forward voltage (V) will decrease ...
The forward voltage for single-die high-power light-emitting diodes (LEDs) driven at currents within...
In addition, the authors discuss the charge distribution conditions in the depleted region of a line...