Schottky barrier (SB) formation at the contact interface between metal and semiconducting carbon nanotubes (CNTs) is of great importance in determining the transport characteristics of a CNT field effect transistor. In this paper, we studied the SB height (SBH) between different metals and CNT contacts using first-principles calculation. A method to calculate SBH is proposed based on the interface dipole effect, which will induce an electrical potential variation at the metal and CNT interface. The SBH of a metal and CNT contact could then be determined by the work function difference between the metal and CNT and the electrical potential variation. We extensively investigated different contacts between Sc, Al, Pd, (8,0) CNT, and (11,0) CNT...
By using first-principles calculations and classical image force model, we studied the image force i...
A theoretical study of the a semiconducting carbon nanotube (CNT) bonding to an aluminum electrode i...
We report on the interfacial structure, the current−voltage (I−V) characteristics, and contact resis...
Semiconducting carbon nanotubes (CNTs) have several properties that are advantageous for field effec...
Single-wall carbon nanotube field-effect transistors (CNFETs) have been shown to behave as Schottky ...
Single-wall carbon nanotube field-effect transistors (CNFETs) have been shown to behave as Schottky ...
In this paper, we predict the current−voltage (I−V) characteristics and contact resistance of “end-c...
Reported in this paper is a quantum mechanics study on the electronic structure and contact resistan...
The paper addresses the issue of Schottky barrier effects in carbon Nanotube field effect transistor...
We have fabricated p-type and n-type carbon nanotube transistors(CNTFETs) by using high and low work...
We have fabricated electrical devices based on thermal chemical vapor deposition (TCVD) grown single...
Direct measurements are presented of the Schottky barrier (SB) heights of carbon nanotubedevices con...
Carbon nanotubes is excellent for nanoelectronic devices due to their unique structural and electric...
To realize carbon nanotube (CNT) as on-chip interconnect materials, the contact resistance stemming ...
Our first-principles study of the contact between a semiconducting single-walled carbon nanotube ~s...
By using first-principles calculations and classical image force model, we studied the image force i...
A theoretical study of the a semiconducting carbon nanotube (CNT) bonding to an aluminum electrode i...
We report on the interfacial structure, the current−voltage (I−V) characteristics, and contact resis...
Semiconducting carbon nanotubes (CNTs) have several properties that are advantageous for field effec...
Single-wall carbon nanotube field-effect transistors (CNFETs) have been shown to behave as Schottky ...
Single-wall carbon nanotube field-effect transistors (CNFETs) have been shown to behave as Schottky ...
In this paper, we predict the current−voltage (I−V) characteristics and contact resistance of “end-c...
Reported in this paper is a quantum mechanics study on the electronic structure and contact resistan...
The paper addresses the issue of Schottky barrier effects in carbon Nanotube field effect transistor...
We have fabricated p-type and n-type carbon nanotube transistors(CNTFETs) by using high and low work...
We have fabricated electrical devices based on thermal chemical vapor deposition (TCVD) grown single...
Direct measurements are presented of the Schottky barrier (SB) heights of carbon nanotubedevices con...
Carbon nanotubes is excellent for nanoelectronic devices due to their unique structural and electric...
To realize carbon nanotube (CNT) as on-chip interconnect materials, the contact resistance stemming ...
Our first-principles study of the contact between a semiconducting single-walled carbon nanotube ~s...
By using first-principles calculations and classical image force model, we studied the image force i...
A theoretical study of the a semiconducting carbon nanotube (CNT) bonding to an aluminum electrode i...
We report on the interfacial structure, the current−voltage (I−V) characteristics, and contact resis...