In this letter, a reliable nonvolatile resistive switching device based on silicon monoxide (SiO) is demonstrated. The device was fabricated with a low-temperature process that can be compatible with a CMOS back-end process and attractive for 3-D memory integration. The fabricated Cu/SiO/W device was found to have a repeatable unipolar resistive switching behavior. The results show excellent on/off resistance ratio (over 10(4)) and good retention performance. The switching mechanism of the device is analyzed by experimental data and probably can be attributed to the behaviors of copper ions in the bulk of SiO under different voltages.http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=...
Unipolar resistive switching memory characteristics using high-κ Al2O3 film in an IrOx/Al2O3/SiO2/p-...
A mixed-NiOx/NiOy-film-based unipolar-type resistive switching memory device is proposed and fabrica...
The resistive switching properties of NiO-based memory cells were investigated utilizing test struct...
Scalable nonvolatile memory devices that operate at low voltage and current, exhibit multilevel cell...
This paper discusses the resistive switching devices based on highly compatible silicon-rich-oxide, ...
We developed nonvolatile metal/SiOx/Si memristive devices based on ultrathin (∼1 nm) silicon oxide t...
Interest in resistance switching is currently growing apace. The promise of novel high-density, low-...
Interest in resistance switching is currently growing apace. The promise of novel high‐density, low‐...
Ultra-low current resistive switching in sputtered Cu/SiO2/Pt and Cu/SiO2/Ir structures was investig...
We investigate the resistive switching power from unipolar resistive switching current-voltage chara...
textFloating gate (FG) nonvolatile memory has been the main structure of nonvolatile memory devices,...
Resistive switching of W/amorphous (a)-SiOxCy:H/Cu resistive memories incorporating solely native ba...
Flash memory has been the fastest growing non-volatile memory technology, and it has been widely use...
Resistive switching characteristics of Ag/SiO2/Pt memory cells with different set current compliance...
Voltage-controlled resistive switching in various gap systems on SiO2 substrates is demonstrated. Th...
Unipolar resistive switching memory characteristics using high-κ Al2O3 film in an IrOx/Al2O3/SiO2/p-...
A mixed-NiOx/NiOy-film-based unipolar-type resistive switching memory device is proposed and fabrica...
The resistive switching properties of NiO-based memory cells were investigated utilizing test struct...
Scalable nonvolatile memory devices that operate at low voltage and current, exhibit multilevel cell...
This paper discusses the resistive switching devices based on highly compatible silicon-rich-oxide, ...
We developed nonvolatile metal/SiOx/Si memristive devices based on ultrathin (∼1 nm) silicon oxide t...
Interest in resistance switching is currently growing apace. The promise of novel high-density, low-...
Interest in resistance switching is currently growing apace. The promise of novel high‐density, low‐...
Ultra-low current resistive switching in sputtered Cu/SiO2/Pt and Cu/SiO2/Ir structures was investig...
We investigate the resistive switching power from unipolar resistive switching current-voltage chara...
textFloating gate (FG) nonvolatile memory has been the main structure of nonvolatile memory devices,...
Resistive switching of W/amorphous (a)-SiOxCy:H/Cu resistive memories incorporating solely native ba...
Flash memory has been the fastest growing non-volatile memory technology, and it has been widely use...
Resistive switching characteristics of Ag/SiO2/Pt memory cells with different set current compliance...
Voltage-controlled resistive switching in various gap systems on SiO2 substrates is demonstrated. Th...
Unipolar resistive switching memory characteristics using high-κ Al2O3 film in an IrOx/Al2O3/SiO2/p-...
A mixed-NiOx/NiOy-film-based unipolar-type resistive switching memory device is proposed and fabrica...
The resistive switching properties of NiO-based memory cells were investigated utilizing test struct...