Effects of 120 keV nitrogen and its fluence on the structural, electrical, and optical properties of ZnO film

P-type ZnO film was obtained by N-implantation at energy of 120 keV with annealing at 850 degrees C in oxygen. Room temperature Hall effect measurements revealed that the carrier concentration and mobility was 9.95 x 10(18) cm(-3) and 14.3 cm(2)/vs, respectively, in the implanted ZnO with optimal fluence of 10(15) N/cm(2), where more N acceptors were activated as confirmed by X-ray diffraction and photoluminescence. The increase of lattice constants and appearance of emission peaks at 3.26 and 3.18 eV after implantation indicated that the p-type ZnO was realized by substitution of N atom for O sublattice. (C) 2008 Elsevier B.V. All rights reserved.http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000257721300066&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701Instruments & InstrumentationNuclear Science & TechnologyPhysics, Atomic, Molecular & ChemicalPhysics, NuclearSCI(E)EICPCI-S(ISTP)