Fault Detection for FPGA's Logic Resources on Test System

唐恒标
冯建华
冯建科

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Publication date

January 2006

DOI

10.3969/j.issn.1004-3365.2006.03.010

Publisher

微电子学

Journal

issn:1004-3365

Abstract

FPGA在许多领域已经得到广泛应用,其测试问题也显得越来越突出.文章针对基于SRAM结构FPGA的特点,以Xilinx公司的XC4000系列芯片为例,利用检测可编程逻辑资源的多逻辑单元(CLB)混合故障的测试方法,阐述了如何在BC3192V50测试系统上实现FPGA的在线配置以及功能和参数测试.它是一种基于测试系统的通用的FPGA配置和测试方法.中国科学院资助项目中文核心期刊要目总览(PKU)中国科学引文数据库(CSCD)03292-295,2993

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Fault Detection for FPGA's Logic Resources on Test System

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Fault Detection for FPGA's Logic Resources on Test System

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