In recent years, circuit reliability in modern high-performance processors has become increasingly important. Shrinking feature sizes and diminishing supply voltages have made circuits more sensitive to microprocessor supply voltage fluctuations. These fluctuations result from the natural variation of processor activity as workloads execute, but when left unattended, these voltage fluctuations can lead to timing violations or even transistor lifetime issues. In this article, we present a hardware--software collaborative approach to mitigate voltage fluctuations. A checkpoint-recovery mechanism rectifies errors when voltage violates maximum tolerance settings, while a runtime software layer reschedules the program's instruction stream to pre...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Microprocessor designers use techniques such as clock gat-ing to reduce power dissipation. An unfort...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
Increases in peak current draw and reductions in the oper-ating voltages of processors continue to a...
Increases in peak current draw and reductions in the operating volt-ages of processors continue to a...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Scaling of semiconductor devices has enabled higher levels of integration and performance improvemen...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Microprocessor designers use techniques such as clock gat-ing to reduce power dissipation. An unfort...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Current processor designs have a critical operating point that sets a hard limit on voltage scaling....
Increases in peak current draw and reductions in the oper-ating voltages of processors continue to a...
Increases in peak current draw and reductions in the operating volt-ages of processors continue to a...
As machines increase in scale, it is predicted that failure rates of supercomputers will correspondi...
Rising PVT variations at advanced process nodes make it increasingly difficult to meet aggressive pe...
Scaling of semiconductor devices has enabled higher levels of integration and performance improvemen...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...