Add to ORKGIn this paper, we characterize the impact of compiler optimizations on voltage noise. While intuition may suggest that the better processor utilization ensured by optimizing compilers results in a small amount of voltage variation, our measurements on a Intel® Core™2 Due Processor show the opposite - the majority of SPEC 2006 benchmarks exhibit more voltage droops when aggressively optimized. We show that this increase in noise could be sufficient for a net performance decrease in a typical case, resilient design.Engineering and Applied Science
Abstract—Voltage noise characterization is an essential aspect of optimizing the shipped voltage of ...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...
Abstract—In this paper, we characterize the impact of compiler optimizations on voltage noise. While...
Voltage variations are a major challenge in processor design. Here, researchers characterize the vol...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Sensitivity of the microprocessor to voltage fluctuations is becoming a major concern with growing e...
Sensitivity of the microprocessor to voltage fluctuations is becoming a major concern with growing e...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract—Voltage noise characterization is an essential aspect of optimizing the shipped voltage of ...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...
Abstract—In this paper, we characterize the impact of compiler optimizations on voltage noise. While...
Voltage variations are a major challenge in processor design. Here, researchers characterize the vol...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Abstract—Parameter variations have become a dominant chal-lenge in microprocessor design. Voltage va...
Sensitivity of the microprocessor to voltage fluctuations is becoming a major concern with growing e...
Sensitivity of the microprocessor to voltage fluctuations is becoming a major concern with growing e...
Parameter variations have become a dominant challenge in microprocessor design. Voltage variation is...
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
textReliability is one of the important issues of recent microprocessor design. Processors must pro...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
Abstract—Voltage noise characterization is an essential aspect of optimizing the shipped voltage of ...
As processor clock gating becomes more and more prevalent, the resulting processor current fluctuati...
Abstract—Voltage droops resulting from inductive noise are common in state-of-the-art processors. Ma...