Add to ORKGThe purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of the Intel Optane Memory device (SSD) containing the 3D Xpoint phase change memory (PCM) technology. This test is supported by the NASA Electronics Parts and Packaging Program (NEPP)
The JEDEC JESD57 test standard, Procedures for the Measurement of Single-Event Effects in Semiconduc...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...
Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC); here...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) comple...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
Hardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor / System...
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
This is an update to the ongoing series of presentations tracking the state of domestic proton facil...
Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. ...
The JEDEC JESD57 test standard, Procedures for the Measurement of Single-Event Effects in Semiconduc...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...
Single-Event Effects (SEE) testing was conducted on the nVidia Jetson TX1 System on Chip (SOC); here...
This presentation reports the results of recent proton and heavy ion Single Event Effect (SEE) testi...
We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) comple...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
Hardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor / System...
In the wake of the closure of the Indiana University Cyclotron Facility (IUCF), this presentation pr...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...
Total ionizing dose and displacement damage testing was performed to characterize and determine the ...
This is an update to the ongoing series of presentations tracking the state of domestic proton facil...
Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. ...
The JEDEC JESD57 test standard, Procedures for the Measurement of Single-Event Effects in Semiconduc...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
A literature review of the near-Earth trapped radiation of the Van Allen Belts, the radiation within...