Add to ORKGWe present SEU test and analysis of the Microsemi ProASIC3 FPGA. SEU Probability models are incorporated for device evaluation. Included is a comparison to the RTAXS FPGA illustrating the effectiveness of the overall testing methodology
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
The high-radiation environment in space can lead to anomalies in normal satellite operation. A major...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
It has been shown that, when exposed to radiation environments, each Field Programmable Gate Array (...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
FPGAs are an appealing solution for space-based remote sensing applications. However, an a low-earth...
This presentation on Field Programmable Gate Array (FPGA) Devices will include challenges for critic...
In the Ph.D. thesis1 from which this summary has been extracted the author proposed a framework of m...
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
The high-radiation environment in space can lead to anomalies in normal satellite operation. A major...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We propose a method for the application of single event upset (SEU) data towards the analysis of com...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independen...
We present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4...
It has been shown that, when exposed to radiation environments, each Field Programmable Gate Array (...
This presentation provides an overview of single event effects in FPGA devices 2015-2016 including c...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...
Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...
FPGAs are an appealing solution for space-based remote sensing applications. However, an a low-earth...
This presentation on Field Programmable Gate Array (FPGA) Devices will include challenges for critic...
In the Ph.D. thesis1 from which this summary has been extracted the author proposed a framework of m...
SRAM-based field programmable gate arrays (FPGAs) are particularly sensitive to single ev...
The high-radiation environment in space can lead to anomalies in normal satellite operation. A major...
The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...