Traditional approaches for power optimization during high level synthesis, have targetted single-cycle designs where only one input is being processed by the datapath at any given time. Throughput of large single-cycle designs can be improved by means of pipelining. In this work, we present a framework for the high-level synthesis of pipelined datapaths with low leakage power dissipation. We explore the effect of pipelining on the leakage power dissipation of data-flow intensive designs. An algorithm for minimization of leakage power during behavioral pipelining is presented. The transistor level leakage reduction technique employed here is based on Multi-Threshold CMOS (MTCMOS) technology. Pipelined allocation of functional units and regis...
This paper presents a design tool for the synthesis of pipeline ADCs which is able to optimally map ...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...
Traditional approaches for power optimization during high level synthesis, have targetted single-cyc...
Traditional approaches for power optimization during high level synthesis, have targetted single-cyc...
As technology scales down and CMOS circuits are powered by lower supply voltages, standby leakage cu...
As technology scales down and CMOS circuits are powered by lower supply voltages, standby leakage cu...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly r...
A novel transistor-level synthesis procedure for pipeline ADCs is presented. This procedure is able ...
Supply voltages and threshold voltages continue to be aggressively scaled down in order to obtain po...
This paper presents a model and a method for the allocation during the high level datapath synthesis...
This paper presents a model and a method for the allocation during the high level datapath synthesis...
This paper presents a design tool for the synthesis of pipeline ADCs which is able to optimally map ...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...
Traditional approaches for power optimization during high level synthesis, have targetted single-cyc...
Traditional approaches for power optimization during high level synthesis, have targetted single-cyc...
As technology scales down and CMOS circuits are powered by lower supply voltages, standby leakage cu...
As technology scales down and CMOS circuits are powered by lower supply voltages, standby leakage cu...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
The rising power demands and cost motivates us to explore low power solutions in electronics. In nan...
Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly r...
A novel transistor-level synthesis procedure for pipeline ADCs is presented. This procedure is able ...
Supply voltages and threshold voltages continue to be aggressively scaled down in order to obtain po...
This paper presents a model and a method for the allocation during the high level datapath synthesis...
This paper presents a model and a method for the allocation during the high level datapath synthesis...
This paper presents a design tool for the synthesis of pipeline ADCs which is able to optimally map ...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...
With aggressive scaling of device dimensions, threshold voltages and oxide-thicknesses, leakage-powe...