A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an atomic force microscopy (AFM) for sub-nanometre range positioning of a sample. High-precision nanopositioning of the PTS is a major requirement for a high-speed imaging using the AFM. The main motivation to this thesis is to propose suitable control methods for high-speed imaging using an AFM. The scanning speed of a commercial AFM is limited by the positioning accuracy of its scanner which has the following problems: i) creep effect in slow-speed scanning; ii) hysteresis effect during large range scanning (which both result in inaccurate reference motion tracking); iii) cross-coupling effect among the axes of the scanner; and iv) vibration effect at ...
Most commercially available Atomic Force Microscopes (AFMs) use piezoelectric tube nano-positioners ...
Research Doctorate - Doctor of Philosophy (PhD)Design of instruments that are capable of visualising...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In ...
An optimal controller for high-precision spiral positioning of a piezoelectric tube scanner used in ...
An optimal controller for high-precision spiral positioning of a piezoelectric tube scanner used in ...
The performance of the atomic force microscope (AFM), a nanoscale imaging tool, is significantly inf...
Research Doctorate - Doctor of Philosophy (PhD)The performance of piezoelectric tube scanner in Atom...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
Atomic force microscopes (AFMs) are used in many nanopositioning applications inorder to measure the...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
Most commercially available Atomic Force Microscopes (AFMs) use piezoelectric tube nano-positioners ...
Research Doctorate - Doctor of Philosophy (PhD)Design of instruments that are capable of visualising...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
This paper considers a high-speed spiral scanning method using an atomic force microscope (AFM). In ...
An optimal controller for high-precision spiral positioning of a piezoelectric tube scanner used in ...
An optimal controller for high-precision spiral positioning of a piezoelectric tube scanner used in ...
The performance of the atomic force microscope (AFM), a nanoscale imaging tool, is significantly inf...
Research Doctorate - Doctor of Philosophy (PhD)The performance of piezoelectric tube scanner in Atom...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
This paper presents experimental implementation of a positive position feedback (PPF) control scheme...
Atomic force microscopes (AFMs) are used in many nanopositioning applications inorder to measure the...
In most nanotechnology applications, speed and precision are important requirements for obtaining go...
Most commercially available Atomic Force Microscopes (AFMs) use piezoelectric tube nano-positioners ...
Research Doctorate - Doctor of Philosophy (PhD)Design of instruments that are capable of visualising...
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Ca...