The aim of this thesis is to show how the robust H infinity control method can be applied to fast tracking position control problems in nano-positioning and atomic force microscopy. The key component used in the nano-positioning system and atomic force microscope positioning system is a piezoelectric actuator which makes motion control at the sub-nanometer level possible. A significant challenging issue in the use of piezoelectric actuators is the existence of hysteresis nonlinearity which limits the accuracy of position control. This research involves designing three robust H infinity tracking controllers for three different systems: controlling hysteresis nonlinearity in a piezoelectric stack actuator using a charge output, controlling di...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text ...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
International audienceThis paper deals with robust closed-loop control of a nano-robotic system dedi...
International audienceThis paper deals with robust closed-loop control of a nano-robotic system dedi...
In this paper, a novel scheme is presented to simultaneously compensate the inherent creep and hyste...
Abstract- An atomic force microscope (AFM) has been utilized to implement various manipulations with...
Piezoelectrically-driven (piezoactive) systems such as nanopositioning platforms, scanning probe mic...
n this study, the Coleman-hysteresis model is utilised in the piezoelectric actuator (PZTA) dynamic ...
Piezoelectric-stack actuated platforms are utilized in many nanopositioning applications. Their perf...
A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an atomic fo...
Piezoelectrically-driven (piezoactive) systems such as nanopositioning platforms, scanning probe mic...
Piezoelectrically actuated nanopositioning systems (tube or platform type) are widely employed in ap...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text ...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
In this paper, a robust controller for the positioning of a piezoelectric tube scanner (PTS) used in...
International audienceThis paper deals with robust closed-loop control of a nano-robotic system dedi...
International audienceThis paper deals with robust closed-loop control of a nano-robotic system dedi...
In this paper, a novel scheme is presented to simultaneously compensate the inherent creep and hyste...
Abstract- An atomic force microscope (AFM) has been utilized to implement various manipulations with...
Piezoelectrically-driven (piezoactive) systems such as nanopositioning platforms, scanning probe mic...
n this study, the Coleman-hysteresis model is utilised in the piezoelectric actuator (PZTA) dynamic ...
Piezoelectric-stack actuated platforms are utilized in many nanopositioning applications. Their perf...
A piezoelectric tube scanner (PTS) is made of a piezoelectric material (PZM) is used in an atomic fo...
Piezoelectrically-driven (piezoactive) systems such as nanopositioning platforms, scanning probe mic...
Piezoelectrically actuated nanopositioning systems (tube or platform type) are widely employed in ap...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...
Covering the complete design cycle of nanopositioning systems, this is the first comprehensive text ...
Atomic force microscopes offer the possibility for imaging a sample topography with accuracy in the ...