Entirely complex oxide ferromagnetic / ferroelectric / ferromagnetic tunnel junctions were created via Pulsed Laser Deposition (PLD) and patterned into three dimensional tunnel junction structures via photolithography. The system under investigation comprised multiferroic (001) orientated Bismuth Ferrite (BFO) as the tunnel barrier with (001) orientated Lanthanum Strontium Manganate (LSMO) as the magnetic electrodes. The deposited heterostructures were found to be epitaxial, phase pure and atomically smooth, confirmed via X – ray analysis, transmission electron microscopy and atomic force microscope techniques. The magnetic properties of the electrodes (LSMO) were probed by Ferro Magnetic Resonance (FMR) experiments to reveal a thickne...
Magnetic tunnel junctions (MTJs) with tunable tunneling magnetoresistances (TMR) have already been p...
We have studied novel ferromagnetic (FM) materials and FM electrode/tunnel barrier interfaces in mag...
The electronic reconstruction occurring at oxide interfaces may be the source of interesting device ...
Magnetoelectric random access memory (MERAM) has emerged as a promising new class of non-volatile so...
Tunnelling Magnetoresistance (TMR) has attracted intensive attention these years since 1975. It can ...
As semiconductor devices reach ever smaller dimensions, the challenge of power dissipation and quant...
The phenomenon of quantum mechanical electron tunneling is widely used in device technology, of whic...
A multiferroic tunnel junction (MFTJ) promisingly offers multinary memory states in response to elec...
Ferroelectric tunnel barriers in between two ferromagnetic electrodes (multiferroic tunnel junctions...
Multiferroic bismuth ferrite (BFO), which possesses both ferroelectric and anti-ferromagnetic orderi...
The range of recently discovered phenomena in complex oxide heterostructures, made possible owing to...
Magnetic tunnel junctions (MTJs), composed of two ferromagnetic electrodes separated by a thin insul...
Magnetic tunnel junctions (MTJs), composed of two ferromagnetic electrodes separated by a thin insul...
The electronic reconstruction occurring at oxide interfaces may be the source of interesting device ...
The authors report the fabrication of ferromagnet-insulator-ferromagnet junction devices using a ram...
Magnetic tunnel junctions (MTJs) with tunable tunneling magnetoresistances (TMR) have already been p...
We have studied novel ferromagnetic (FM) materials and FM electrode/tunnel barrier interfaces in mag...
The electronic reconstruction occurring at oxide interfaces may be the source of interesting device ...
Magnetoelectric random access memory (MERAM) has emerged as a promising new class of non-volatile so...
Tunnelling Magnetoresistance (TMR) has attracted intensive attention these years since 1975. It can ...
As semiconductor devices reach ever smaller dimensions, the challenge of power dissipation and quant...
The phenomenon of quantum mechanical electron tunneling is widely used in device technology, of whic...
A multiferroic tunnel junction (MFTJ) promisingly offers multinary memory states in response to elec...
Ferroelectric tunnel barriers in between two ferromagnetic electrodes (multiferroic tunnel junctions...
Multiferroic bismuth ferrite (BFO), which possesses both ferroelectric and anti-ferromagnetic orderi...
The range of recently discovered phenomena in complex oxide heterostructures, made possible owing to...
Magnetic tunnel junctions (MTJs), composed of two ferromagnetic electrodes separated by a thin insul...
Magnetic tunnel junctions (MTJs), composed of two ferromagnetic electrodes separated by a thin insul...
The electronic reconstruction occurring at oxide interfaces may be the source of interesting device ...
The authors report the fabrication of ferromagnet-insulator-ferromagnet junction devices using a ram...
Magnetic tunnel junctions (MTJs) with tunable tunneling magnetoresistances (TMR) have already been p...
We have studied novel ferromagnetic (FM) materials and FM electrode/tunnel barrier interfaces in mag...
The electronic reconstruction occurring at oxide interfaces may be the source of interesting device ...