International audienceInvited paper The modeling of microwave transistors in the field of RF and Microwave circuits design is an inevitable task. The developed model must be capable of predicting the non-linear characteristics of the active transistor which has a significant role in the design of RFPA and oscillators. This necessitates the measurement of low-frequency (LF) noise sources in order to model them electrically and thereby optimises the impact of noise in the case of oscillator design. A dedicated low-frequency noise measurement setup [1] has been developed at XLIM laboratory which allows the measurement of low-noise spectral densities at the ports of the device under both DC and large-signal operation regime. Furthermore, the ex...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled Non...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...
International audienceInvited paper The modeling of microwave transistors in the field of RF and Mic...
We have measured low frequency s-parameters of GaAs HBTs on wafer and found the dispersion could be ...
Abstract — This paper is a summary of our research in the field of noise in oscillators. An origina...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
This workshop provides a comprehensive overview on recent advances in several areas of low-noise osc...
This workshop provides a comprehensive overview on recent advances in several areas of low-noise osc...
An empirical nonlinear noise model for bipolar transistors, deriving from the charge-controlled nonl...
An empirical nonlinear noise model for bipolar transistors, deriving from the charge-controlled nonl...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled No...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled No...
A procedure which may be used to analyze the noise characteristics of HBT oscillators is presented. ...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled Non...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...
International audienceInvited paper The modeling of microwave transistors in the field of RF and Mic...
We have measured low frequency s-parameters of GaAs HBTs on wafer and found the dispersion could be ...
Abstract — This paper is a summary of our research in the field of noise in oscillators. An origina...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
Minimizing electrical noise is an increasingly important topic. New systems and modulation technique...
This workshop provides a comprehensive overview on recent advances in several areas of low-noise osc...
This workshop provides a comprehensive overview on recent advances in several areas of low-noise osc...
An empirical nonlinear noise model for bipolar transistors, deriving from the charge-controlled nonl...
An empirical nonlinear noise model for bipolar transistors, deriving from the charge-controlled nonl...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled No...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled No...
A procedure which may be used to analyze the noise characteristics of HBT oscillators is presented. ...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...
An empirical non-linear noise model for bipolar transistors, deriving from the Charge-Controlled Non...
This paper addresses advanced low frequency noise measurements and modeling of SiGe HBTs. Results ha...