Future low voltage noise dominated designs render probabilistic behavior of CMOS. This is acceptable as far as applications’ intrinsic error resilience allows quantified inaccuracy in results to save energy consumption, such as in applications like audio/video processing and sky image formation in radio astronomy. This introduces the trade-off between energy consumption (E) and probability of correctness (p) that provides an opportunity for inexact computing to attain higher energy efficiency. Efforts have been made in the last decade to model probabilistic CMOS (PCMOS) keeping in view the noise variance and to establish its feasibility for error resilient applications focused on the nominal voltage range. However, exploiting the near thres...
The demand of extremely long battery life for electronic devices is the driving force for modern sem...
Graduation date: 2014Energy consumption is one of the primary bottlenecks to both large and small sc...
The impact of process fluctuations on the variability of deep sub-micron (DSM) VLSI circuit performa...
Device scaling, the driving force of CMOS technology, led to continuous decrease in the energy level...
Abstract. Highly scaled CMOS devices in the nanoscale regime would inevitably exhibit statistical or...
This paper presents a probabilistic approach to model the problem of power supply voltage fluctuati...
Abstract—This paper presents a probabilistic approach to model the problem of power supply voltage f...
With the continued scaling of chip manufacturing technologies, the significance of process variation...
Abstract—In nanoscale CMOS circuits the random dopant fluc-tuations (RDF) cause significant threshol...
Abstract — Highly scaled CMOS devices in the nanoscale regime would inevitably exhibit statistical o...
Near-threshold computing is essential for energy-efficient operation of VLSI systems, but wide perfo...
© 2014 IEEE. The continued scaling of feature sizes in integrated circuit technology leads to more u...
Today's very deep sub-micron technologies enable highly complex chip designs that operate at very hi...
As mobile and portable information systems are becoming more popular, there is a need for the develo...
Motivated by the necessity to consider probabilistic approaches to future designs, the main objectiv...
The demand of extremely long battery life for electronic devices is the driving force for modern sem...
Graduation date: 2014Energy consumption is one of the primary bottlenecks to both large and small sc...
The impact of process fluctuations on the variability of deep sub-micron (DSM) VLSI circuit performa...
Device scaling, the driving force of CMOS technology, led to continuous decrease in the energy level...
Abstract. Highly scaled CMOS devices in the nanoscale regime would inevitably exhibit statistical or...
This paper presents a probabilistic approach to model the problem of power supply voltage fluctuati...
Abstract—This paper presents a probabilistic approach to model the problem of power supply voltage f...
With the continued scaling of chip manufacturing technologies, the significance of process variation...
Abstract—In nanoscale CMOS circuits the random dopant fluc-tuations (RDF) cause significant threshol...
Abstract — Highly scaled CMOS devices in the nanoscale regime would inevitably exhibit statistical o...
Near-threshold computing is essential for energy-efficient operation of VLSI systems, but wide perfo...
© 2014 IEEE. The continued scaling of feature sizes in integrated circuit technology leads to more u...
Today's very deep sub-micron technologies enable highly complex chip designs that operate at very hi...
As mobile and portable information systems are becoming more popular, there is a need for the develo...
Motivated by the necessity to consider probabilistic approaches to future designs, the main objectiv...
The demand of extremely long battery life for electronic devices is the driving force for modern sem...
Graduation date: 2014Energy consumption is one of the primary bottlenecks to both large and small sc...
The impact of process fluctuations on the variability of deep sub-micron (DSM) VLSI circuit performa...