The work presented in this thesis concernes two sorts of nanostructures: energetic-ion-impact-induced surface tracks and gas-deposited WO3 nanoparticles. Our aims to characterise these nanostuctures and understand the physical principles behind their formation are of general interests for basic science as well as of the field of nanotechnology. AFM studies of irradiated organic surfaces showed that individual ion impacts generate craters, most often accompanied by raised plastically deformed regions. Crater sizes were measured as a function of ion stopping power and incidence angle on various surfaces. Observed crater volumes were converted into estimates of total sputtering yields, which in turn were correlated with data from collector exp...
Thesis (B.A.)--Boston University. University Professors Program Senior theses.PLEASE NOTE: Boston Un...
The aim of this thesis was to further our understanding on the surface dynamics of silicon nanoparti...
Atomic force microscopy ~AFM! and high-resolution transmission electron microscope ~HRTEM! cross sec...
Morphological evolution of surfaces during the course of off-normal cluster ion beam bombardment is ...
Transmission electron microscopy (TEM), atomic force microscopy (AFM) and Rutherford backscattering ...
Although the importance of morphology on the tribological properties of surfaces has long been prove...
Semiconductor nanostructures formed by a surface modification process caused by ion sputtering is st...
International audienceSwift heavy ions can be used to modify material surfaces on the nanometer scal...
The formation of metallic nanostructures by exposure of molybdenum and tungsten surfaces to high flu...
Ion irradiation of metallic nanoparticles (Au, Pt, FePt) on various substrates (SiO2, Si, sapphire) ...
We present systematic scanning tunneling microscopy (STM)/atomic-force microscopic (AFM) investigati...
International audienceMuscovite mica was irradiated with slow highly charged Arq+ (charge state q = ...
Nanostructured materials of various types and forms are formulated in a variety of novel ways and ha...
International audienceWe present experimental and theoretical data on the threshold behaviour of nan...
2 pages, no figures.-- Foreword to Special Section containing Papers on Surface Nanopatterns induced...
Thesis (B.A.)--Boston University. University Professors Program Senior theses.PLEASE NOTE: Boston Un...
The aim of this thesis was to further our understanding on the surface dynamics of silicon nanoparti...
Atomic force microscopy ~AFM! and high-resolution transmission electron microscope ~HRTEM! cross sec...
Morphological evolution of surfaces during the course of off-normal cluster ion beam bombardment is ...
Transmission electron microscopy (TEM), atomic force microscopy (AFM) and Rutherford backscattering ...
Although the importance of morphology on the tribological properties of surfaces has long been prove...
Semiconductor nanostructures formed by a surface modification process caused by ion sputtering is st...
International audienceSwift heavy ions can be used to modify material surfaces on the nanometer scal...
The formation of metallic nanostructures by exposure of molybdenum and tungsten surfaces to high flu...
Ion irradiation of metallic nanoparticles (Au, Pt, FePt) on various substrates (SiO2, Si, sapphire) ...
We present systematic scanning tunneling microscopy (STM)/atomic-force microscopic (AFM) investigati...
International audienceMuscovite mica was irradiated with slow highly charged Arq+ (charge state q = ...
Nanostructured materials of various types and forms are formulated in a variety of novel ways and ha...
International audienceWe present experimental and theoretical data on the threshold behaviour of nan...
2 pages, no figures.-- Foreword to Special Section containing Papers on Surface Nanopatterns induced...
Thesis (B.A.)--Boston University. University Professors Program Senior theses.PLEASE NOTE: Boston Un...
The aim of this thesis was to further our understanding on the surface dynamics of silicon nanoparti...
Atomic force microscopy ~AFM! and high-resolution transmission electron microscope ~HRTEM! cross sec...