Crystallographic statistics.
- Valerie J. O'Sullivan (170598)
- Isabelle Barrette-Ng (170601)
- Eric Hommema (170603)
- Greg T. Hermanson (170607)
- Mark Schofield (170610)
- Sau-Ching Wu (170614)
- Claudia Honetschlaeger (170619)
- Kenneth K.-S. Ng (170625)
- Sui-Lam Wong (170630)
DOIAbstract
a<p>Values from the outermost resolution shell are given in parentheses.</p>b<p>R<sub>sym</sub> = Σ<sub>i</sub>|I<sub>i</sub>−<i>|/Σ<sub>i</sub> I<sub>i</sub> where I<sub>i</sub> is the <i>i</i>th integrated intensity of a given reflection and <i> is the weighted mean of all measurements of I.</i></i></p><i><i>c<p>R<sub>work</sub> = Σ||F<sub>o</sub>|−|F<sub>c</sub>||/Σ|F<sub>o</sub>| for 95% of reflection data used in refinement.</p>d<p>R<sub>free</sub> = Σ||F<sub>o</sub>|−|F<sub>c</sub>||/Σ|F<sub>o</sub>| for 5% of reflection data excluded from refinement.</p>e<p>Root-mean-square deviations from ideal geometry calculated by Procheck <a href="http://www.plosone.org/article/info:doi/10.1371/journal.pone.0035203#pone.0035203-Laskowski1" targe...
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