Correlation between RNFL thickness and TMV measures between Spectralis OCT and Cirrus HD-OCT.

<p>Scatter plot of average RNFL thickness (3a) and TMV (3b) measured by Spectralis OCT plotted against average RNFL thickness and TMV measured by Cirrus HD-OCT (n = 95). There was a strong linear agreement between Spectralis and Cirrus HD-OCT measurements of RNFL thickness (solid line) (r = 0.9622; P<0.001) and TMV (r = 0.9255; P<0.001). The line of equality (dotted line) demonstrates Spectralis measurements of RNFL thickness are slightly higher than with Cirrus HD-OCT, and that Spectralis measurements of TMV are also generally higher than with Cirrus HD-OCT.