DOIAbstract
It is known that errors are introduced due to instrument parameters such as the divergence of the incident X-ray beam, the width of the detector slit and the spacing of the Soller slits. A method to correct for these errors is developed. This allows the use of larger slit widths and incident divergence, leading to increased detected intensities. The method will be of use in powder line profile analysis and particularly in the study of liquids and amorphous solids. The errors are corrected by expanding the scattered intensity as a power series in the scattering angle. The theory for the simple case of a one-dimensional spectrum, scanned by a one-dimensional slit, is develope
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